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| 水稻籽粒不同部位P与Al、Cd、Pb含量的关系 | |
| 引用本文： | 陈义芳,周卫东,刘爱平,陈刚,孙国荣.水稻籽粒不同部位P与Al、Cd、Pb含量的关系[J].江苏农业学报,2007,23(2):93-97. |
| 作者姓名： | 陈义芳 周卫东 刘爱平 陈刚 孙国荣 |
| 作者单位： | 1. 扬州大学测试中心,江苏,扬州,225009 2. 扬州大学生物科学与技术学院,江苏,扬州,225009 3. 扬州大学农学院,江苏,扬州,225009 |
| 摘 要： | 利用环境扫描电镜结合X射线电子探针显微分析技术,研究了水稻籽粒不同部位P与Al、Cd、Pb含量的关系.结果表明:金属元素Al、Cd、Pb和其他矿质元素一样,也在糊粉层中积累最多;水稻籽粒中P的积累与Al、Cd、Pb的富集有密切关系;其中,籽粒不同部位P与Al的含量存在极显著的正相关关系,而Pb和Cd的含量并不随着P含量的增加而增加,其变化幅度较小.说明P对Al的富集具有促进作用. |
| 关 键 词： | 水稻籽粒 重金属 X射线电子探针显微分析 富集 水稻籽粒 同部位 含量 正相关关系 Content Relationships Rice 作用 变化幅度 存在 富集 积累 糊粉层 矿质元素 金属元素 结果 研究 微分析技术 电子探针 射线 |
| 文章编号： | 1000-4440（2007）02-0093-05 |
| 修稿时间： | 2006-06-09 |
Relationships between Content of P and Those of Al,Cd and Pb in Different Part of Rice Grains |
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| CHEN Yi-fang,ZHOU Wei-dong,LIU Ai-ping,CHEN Gang,SUN Guo-rong.Relationships between Content of P and Those of Al,Cd and Pb in Different Part of Rice Grains[J].Jiangsu Journal of Agricultural Sciences,2007,23(2):93-97. | |
| Authors: | CHEN Yi-fang ZHOU Wei-dong LIU Ai-ping CHEN Gang SUN Guo-rong |
| Institution: | 1. Testing Center of Yangzhou University, Yangzhou 225009, China ; 2. College of Bioscience and Biotechnology, Yangzhou University, Yangzhou 225009 China ; 3. College of Agriculture, Yangzhou University, Yangzhou 225009, China |
| Abstract: | By means of environmental scanning electron microscopy and X-ray electron probe microanalysis,the relationships between relative content of P and those of Al,Cd and Pb in different parts of rice grains were studied.The contents of P,Al,Cd and Pb in rice grain were higher in aleuronic layer while they accumulated little in the center of caryopsis.The P accumulation in rice grains was closely correlated with the enrichments of Al,Cd and Pb,and the significant positive correlation was found between the contents of P and Al in different parts of rice grains,which indicated that the enrichment of Al was promoted by P-accumulation.Besides,with the increase of P,the contents of Pb and Cd did not increase accordingly. |
| Keywords: | rice grain heavy metals X-ray electron probe microanalysis enrichment |
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