| X射线照相对平面缺陷检测能力的研究 |
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| 引用本文： | 郑舜生 杨大荣. X射线照相对平面缺陷检测能力的研究[J]. 湖南农业大学学报(自然科学版), 1992, 19(4) |
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| 作者姓名： | 郑舜生 杨大荣 |
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| 作者单位： | 湖南大学电气工程系(郑舜生)，长沙化工机械厂(杨大荣) |
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| 摘 要： |
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| 关 键 词： | X射线 平面缺陷 检测 薄板 照相 |
Study on the Ability for Detecting the Plane Defects Using X-Ray Photograph |
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| Zheng Shunsheng Yang Darong. Study on the Ability for Detecting the Plane Defects Using X-Ray Photograph[J]. Journal of Hunan Agricultural University, 1992, 19(4) |
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| Authors: | Zheng Shunsheng Yang Darong |
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| Affiliation: | Zheng Shunsheng Yang Darong Department of Electrical Engineering |
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| Abstract: | In this paper,the telation between sensitivity and defect is discussed for detecting plane defects using the X-ray photograph. We propose the concept of the critical width.The critical width for the middle and thin plates is O.O1mm. |
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| Keywords: | X-ray plane defects detection/critical width middle and thin plates |
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