Independent, Alternate, and Simultaneous Selection for Resistance to Anthracnose and Angular Leaf Spot and Effects on Seed Yield in Common Bean (Phaseolus vulgaris L.)

Two double-cross populations were used to evaluate the efficiency of independent, alternate, and simultaneous selection practiced from the F₂ to F₈ for resistance to anthracnose and angular leaf spot of common bean (Phaseolus vulgaris L.). Seven resistant and high-yielding lines were selected from each of the four environments used during this study. These lines and the seven parents involved in two populations were evaluated in an 8 × 8 lattice design with three replications in two cropping seasons. Pathogen inoculum was used to create the three test environments: anthracnose alone, angular leaf spot alone, and anthracnose and angular leaf spot together. All entries were also evaluated in a fourth, disease-free environment. Selection for resistance to anthracnose and angular leaf spot was effective in both populations. Mean disease scores of all selected lines for anthracnose were lower than that of angular leaf spot irrespective of selection environment. Among the three stress environments, yields were higher in the anthracnose environment. However, lines selected alternately for anthracnose and angular leaf spot were usually higher yielding, and the highest yielding line in both populations originated from this selection environment. The mean yield of selected lines was higher and the highest yielding line originated from the population involving a parent (G 1805) belonging to the Mexican highland race ‘Jalisco’. Positive association existed between seed yield of protected and pathogen-inoculated environments. No association was found between resistance to anthracnose and angular leaf spot.