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Molecular Markers for Leaf Rust Resistance Gene Lr45 in Wheat Based on AFLP Analysis
摘    要:

关 键 词:小麦  叶锈病  抗病基因  分子标记  Lr45  AFLP分析

Molecular Markers for Leaf Rust Resistance Gene Lr45 in Wheat Based on AFLP Analysis
Authors:ZHANG Na  YANG Wen-xiang  YAN Hong-fei  LIU Da-qun  CHU Dong  MENG Qing-fang  ZHANG Ting
Institution:1. Department of Plant Pathology, College of Plant Protection/Biological Control Center of Plant Diseases and Pests of Hebei Province,Agricultural University of Hebei, Baoding 071001, P.R. China
2. Department of Plant Pathology, College of Plant Protection/Biological Control Center of Plant Diseases and Pests of Hebei Province,Agricultural University of Hebei, Baoding 071001, P.R. China;Agricultural Department of Hebei Province, Shijiazhuang 050011,P.R.China
Abstract:Amplified fragment length polymorphism (AFLP) analysis was carried out in Thatcher, near isogenic lines (NILs) carrying different genes conferring resistance against wheat leaf rust, and TcLr45 x Thatcher F2 progenies were used to develop markers for Lr45 gene. Sixty AFLP primer combinations were screened and most of them provided clear amplification products, 31 primer combinations displayed polymorphism of TcLr45 in 23 NILs. Two AFLP markers closely linked to the gene Lr45 were acquired: P-AGG/M-GAG261 bp, which was found closely linked to the Lr45 locus at a distance of 0.6 cM on one side, and P-ACA/M-GGT105 bp, which was found at a distance of 1.3 cM on the other side. The specific bands were cloned and subsequently sequenced. The 261-bp fragment produced by P-AGG/M-GAG showed 86% similarity with the sequence of Vulgare Hart I gene; the 105-bp fragment produced by P-ACA/M-GGT showed 96% similarity with the phosphatidylserine decarboxylase gene of the Triticum monococcum. Both included an open reading frame (ORF).
Keywords:wheat leaf rust  AFLP  Lr45  gene localization
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