The inheritance of host plant effect on latency period of wheat leaf rust in spring wheat. I: Estimation of gene action and number of effective factors in F1, F2 and backcross generations |
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Authors: | Th. Jacobs L. H. M. Broers |
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Affiliation: | (1) Department of Plant Breeding (IVP), Agricultural University, P.O. Box 386, 6700 AJ Wageningen, The Netherlands;(2) Present address: wheat program, CIMMYT, Lisboa 27, Apdo Postal 6-641, 06600 Mexico, D.F., Mexico |
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Abstract: | Summary Crosses were made between the highly susceptible Little Club and the partially resistant cultivars Westphal 12A, Akabozu and BH 1146 to obtain F1, F2 and backcross generations. Latency period (LP) was determined in plants inoculated at the young flag leaf stage with a monospore culture of race Flamingo of wheat leaf rust. Broad sense heritability of LP in the F2 averaged 0.8. The genes showed partial to almost complete recessive inheritance. Scaling tests indicated that additive gene action was the most important factor in the inheritance of partial resistance. The tests showed that there were no indications for additive x additive, additive x dominance or dominance x dominance interactions. The number of effective factors was estimated as one or two for Akabozu, three or more for Westphal 12A, and two or three for BH 1146. BH 1146 also possessed a (semi-)dominant gene for a lower infection type which was temperature sensitive in its expression. The genes of the various parents had unequal effect on LP. |
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Keywords: | Triticum aestivum wheat Puccinia recondita f. sp. tritici wheat leaf rust partial resistance latency period gene action oligogenic inheritance transgressive segregation number of genes |
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