Wheat growth and yield under different depth film-bottomed cultivation in sandy land

The crop cultivation with film-bottomed tillage may benefit more, but little is known about the yield and the relationships among the last yield components under different depth film-bottomed tillage. We conducted a field study on sandy land to quantify response of wheat (Triticum aestivum L.) yield and its components under 60, 70 and 90 cm depth film-bottomed tillage. Morphological measurements included yield, plant height (PH), leaf area index (LAI), plant dry weight (PDW), spike per unit area (SPU), length of spike (LS), kernels per spike (KPS) and kernel weight (KW). The results suggested that the film-bottomed tillage significantly improved plant height, leaf area index and plant dry weight during wheat growing period, and increased seven yield components during harvest stage. The best performance of main yield production components always occurred in 70 cm depth treatment that can be effectively used to maximize wheat in sandy land. Correlation of yield production with other yield components except length of spike did not show similar patterns. The mechanism with respect to influence of film-bottomed tillage on wheat yield need further research.