首页 | 本学科首页   官方微博 | 高级检索  
     

结合轻量级麦穗检测模型和离线Android软件开发的田间小麦测产
引用本文:陈佳玮, 李庆, 谭巧行, 桂世全, 王笑, 易福金, 姜东, 周济. 结合轻量级麦穗检测模型和离线Android软件开发的田间小麦测产[J]. 农业工程学报, 2021, 37(19): 156-164. DOI: 10.11975/j.issn.1002-6819.2021.19.018
作者姓名:陈佳玮  李庆  谭巧行  桂世全  王笑  易福金  姜东  周济
作者单位:1.南京农业大学前沿交叉研究院/植物表型组学研究中心/江苏省现代作物生产省部共建协同创新中心,南京 210095;2.南京农业大学工学院,南京 210095;3.南京农业大学农学院,南京 210095;4.南京农业大学经济管理学院,南京 210095;5.英国剑桥作物研究中心/英国国立农业植物研究所,剑桥 CB3 0LE,英国
基金项目:江苏省基础研究计划(BK20191311);江苏省现代农业重点项目(BE2019383);中央高校基本科研专项资金(JCQY201902)
摘    要:单位面积麦穗数是重要的产量构成因素之一,通过该性状和不同品种历史数据在田间完成对小麦产量的预估,对育种栽培和农业生产具有非常重要的意义。该研究基于小麦田间栽培试验提出了一套结合轻量级深度学习技术和小麦测产算法在Android(安卓)智能手机上离线分析单位面积穗数和田间测产的技术方案。首先介绍了手机标准化俯拍小麦冠层和手机端图像预处理算法,再根据灌浆期小麦冠层图像构建了MobileNetV2-YOLOV4深度学习模型对单位面积中的麦穗进行识别,然后结合迁移学习和TensorFlow.lite转换器完成了模型轻量化,最后通过Android SDK和SQLite构建了不同小麦品种在手机端的产量数据库和人机交互图形界面。开发的安卓软件

关 键 词:模型  算法  产量  轻量级深度学习  麦穗计数  Android软件开发  小麦
收稿时间:2021-06-17
修稿时间:2021-10-12

Combining lightweight wheat spikes detecting model and offline Android software development for in-field wheat yield prediction
Chen Jiawei, Li Qing, Tan Qiaoxing, Gui Shiquan, Wang Xiao, Yi Fujin, Jiang Dong, Zhou Ji. Combining lightweight wheat spikes detecting model and offline Android software development for in-field wheat yield prediction[J]. Transactions of the Chinese Society of Agricultural Engineering (Transactions of the CSAE), 2021, 37(19): 156-164. DOI: 10.11975/j.issn.1002-6819.2021.19.018
Authors:Chen Jiawei  Li Qing  Tan Qiaoxing  Gui Shiquan  Wang Xiao  Yi Fujin  Jiang Dong  Zhou Ji
Affiliation:1.Academy for Advanced Interdisciplinary Studies/Plant Phenomics Research Center/Jiangsu Collaborative Innovation Center for Modern Crop Production Co-sponsored by Province and Ministry, Nanjing Agricultural University, Nanjing 210095, China;2.College of Engineering, Nanjing Agricultural University, Nanjing 210095, China;3.College of Agriculture, Nanjing Agricultural University, Nanjing 210095, China;4.College of Economics and Management, Nanjing Agricultural University, Nanjing 210095, China;5.National Institute of Agricultural Botany/Cambridge Crop Research, Cambridge CB3 0LE, UK
Abstract:The number of spikes per unit area is a key yield component for cereal crops such as wheat, which is popularly used in wheat research for crop improvement. With the fast maturity of smartphone imaging hardware and recent advances in image processing and lightweight deep learning techniques, it is possible to acquire high-resolution images using a smartphone camera, followed by the analysis of wheat spikes per unit area through pre-trained artificial intelligence algorithms. Then, by combining detected spike number with variety-based spikelet number and grain weight, it is feasible to carry out a near real-time estimation of yield potential for a given wheat variety in the field. This AI-driven approach becomes more powerful when a range of varieties are included in the training datasets, enabling an effective and valuable approach for yield-related studies in breeding, cultivation, and agricultural production. In this study, we present a novel smartphone-based software application that combines smartphone imaging, lightweight and embedded deep learning, with yield prediction algorithms and applied the software to wheat cultivation experiments. This open-source Android application is called YieldQuant-Mobile (YQ-M), which was developed to measure a key yield trait (i.e. spikes per unit area) and then estimate yield based on the trait. Through YQ-M and smartphones, we standardized the in-field imaging of wheat plots, streamlined the detection of spikes per unit area and the prediction of yield, without a prerequisite of in-field WiFi or mobile network. In this article, we introduce the YQ-M in detail, including: 1) the data acquisition designed to standardize the collection of wheat images from an overhead perspective using Android smartphones; 2) the data pre-processing of the acquired image to reduce the computational time for image analysis; 3) the extraction of wheat spike features through deep learning (i.e. YOLOV4) and transfer learning; 4) the application of TensorFlow.lite to transform the trained model into a lightweight MobileNetV2-YOLOV4 model, so that wheat spike detection can be operated on an Android smartphone; 5) finally, the establishment of a mobile phone database to incorporate historic datasets of key yield components collected from different wheat varieties into YQ-M using Android SDK and SQLite. Additionally, to ensure that our work could reach the broader research community, we developed a Graphical User Interface (GUI) for YQ-M, which contains: 1) the spike detection module that identifies the number of wheat spikes from a smartphone image; 2) the yield prediction module that invokes near real-time yield prediction using detected spike numbers and related parameters such as wheat varieties, place of production, accumulated temperature, and unit area. During our research, we have tested YQ-M with 80 representative varieties (240 1 m2 plots, three replicates) selected from the main wheat producing areas in China. The computed accuracy, recall, average accuracy, and F1-score for the learning model are 84.43%, 91.05%, 91.96%, and 0.88, respectively. The coefficient of determination between YQ-M predicted yield values and post-harvest manual yield measurement is 0.839 (n=80 varieties, P<0.05; Root Mean Square Error=17.641 g/m2). The results suggest that YQ-M presented here has a high accuracy in the detection of wheat spikes per unit area and can produce a consistent yield prediction for the selected wheat varieties under complex field conditions. Furthermore, YQ-M can be easily accessed and expanded to incorporate new varieties and crop species, indicating the usability and extendibility of the software application. Hence, we believe that YQ-M is likely to provide a step change in our abilities to analyze yield-related components for different wheat varieties, a low-cost, accessible, and reliable approach that can contribute to smart breeding, cultivation and, potentially, agricultural production.
Keywords:models   algorithm   yields   lightweight deep learning   wheat spike detection   Android system development   wheat
本文献已被 万方数据 等数据库收录!
点击此处可从《农业工程学报》浏览原始摘要信息
点击此处可从《农业工程学报》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号