首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Inheritance of angular leaf spot resistance in common bean line BAT 332 and identification of RAPD markers linked to the resistance gene
Authors:Eveline Teixeira Caixeta  Aluízio Borém  Samir de Azevedo Fagundes  Silvia Niestche  Everaldo Gonçalves de Barros  Maurílio Alves Moreira
Institution:1. Instituto de Biotecnologia Aplicada à Agropecuária (BIOAGRO), Universidade Federal de Vi?osa, 36570-000, Vi?osa, MG, Brazil
2. Dept. Fitotecnia, Universidade Federal de Vi?osa, 36570-000, Vi?osa, MG, Brazil
5. Unimontes, Janaúba, MG, Brazil
3. Dept. Biologia Geral/BIOAGRO, Universidade Federal de Vi?osa, 36570-000, Vi?osa, MG, Brazil
4. Depto Bioquímica e Biologia Molecular/BIOAGRO, Universidade Federal de Vi?osa, 36570-000, Vi?osa, MG, Brazil
Abstract:The existence of genetic variability for angular leaf spot (ALS) resistance in the common bean germplasm allows the development of breeding lines resistant to this disease. The BAT 332 line is an important resistance source to common bean ALS. In this work we determined the inheritance pattern and identified RAPD markers linked to a resistance gene present in BAT 332. Populations F1, F2,BCs and BCr derived from crosses between BAT 332 and cultivar Rudá were used. Rudá is a commercial cultivar with carioca type grains and susceptible to ALS. The resistance of BAT 332 to race 61.41 of the pathogen was confirmed. Segregation analysis of the plants indicated that a single dominant gene confers resistance. For identification of RAPD markers linked to the resistance gene, bulk segregant analysis (BSA) was used. Two RAPD markers,OPAA07950 and OPAO12950, linked in coupling phase at 5.10 and 5.83 cM of this gene, respectively, were identified. These molecular markers are important for common bean breeders and geneticists as source of genetic information and for marker assisted selection in breeding programs. This revised version was published online in July 2006 with corrections to the Cover Date.
Keywords:angular leaf spot            Phaeoisariopsis griseola            RAPD markers  resistance inheritance
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号