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Variation of characters in near-isogenic lines of wheat with added genes for leaf rust resistance
Authors:P M Fried  H Winzeler
Institution:(1) Swiss Federal Research Station for Agronomy, Reckenholzstrasse 192, 8046 Zurich, Switzerland
Abstract:Summary Using the cultivar Arina as the recurrent parent, six backcrosses were made with two donor lines carrying the leaf rust resistance genes Lr1 and Lr9, respectively. Selection for leaf rust resistance occurred at the seedling stage in the greenhouse; the first plants transferred to the field were BC6F4s. Frequency distribution of the 332 Lr1/7 × Arina and the 335 Lr9/7 × Arina lines showed continuous variation for yellow rust resistance and heading date in these leaf rust near-isogenic lines (NILs). Similar results were also obtained for plant height, for resistance to powdery mildew and glume blotch, as well as for baking quality characters in another set of more advanced NILs. The available information on the behaviour of one of the parents of cultivar Arina led to the conclusion that the expressed yellow rust resistance is quantitative and might possibly be durable.
Keywords:Triticum aestivum  wheat  near-isogenic lines  NILs  Puccinia recondita f  sp  tritici  leaf rust  Puccinia striiformis  yellow rust  backcross  variation  background resistance
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