X-ray Measurements near High-Power Klystrons

The intensity and quality of the x-radiation outside the lead shielding around ultrahigh-frequency and S-band klystrons were measured as a function of high voltage, pulse frequency, and microwave power output by use of ionization chambers. Independent 20 percent increases in each variable gave, respectively, 8-, 1.2-, and 1.5-fold increases in the intensity, and 36, 1, and 4 percent increases in the mean energy of the x-rays.