连续升温电导法测定小麦叶片胞质稳定性的拐点求证方法比较与分析

本研究以A／D转换器完善了连续升温电导法测定冬小麦叶片质膜稳定性的方法。可用2条直线对电解质外渗的数学模型描述：拐点前基本无电解质渗漏，其电导率的升高与电导率．温度系数有关，拐点后到80℃前也为直线，2条直线的交点为拐点温度。无胁迫条件下冬小麦的叶片变性温度与其抗旱性有一定关联，总趋势是变性温度越低，抗旱性越强；水分胁迫条件下叶片质膜变性温度与抗旱性的关系不确定。因本研究所用材料数量有限，抗旱性差异不很大，在现有条件下，变性温度还不足以成为冬小麦抗旱性鉴别的依据。

Comparison and Analysis on Determination Method for Inflection Point of Membrane Stability of Wheat Leaf by Continuous Rising Temperature Conductance Method

The determination method of winter wheat leaf membrane stability by continuous rising temperature conductance method was improved by using A/D interface.The mathematical model could be described by two lines,there was almost no electrolyte leakage before the inflection point,the increase of electrical conductivity(EC)was linear related with the temperature coefficient,another linear relationship between EC and temperature was from the inflection point to 80 ℃,and the intersection point of two lines was called inflection temperature(IT).The denaturation temperature of leaf membrane had a certain relation to the drought resistance under no stress,and lower the denaturation temperature,higher the drought resistance.The relationship between denaturation temperature of leaf membrane and drought resistance was not certain under water stress.Because of the limited varieties tested,there was little difference in the drought resistance.The denaturation temperature was not enough to the identification basis of drought resistance under the current conditions.