首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Map-based investigation of soil physical conditions and crop yield using diverse sensor techniques
Authors:Y Sun  H Druecker  E Hartung  H Hueging  Q Cheng  Q Zeng  W Sheng  J Lin  O Roller  S Paetzold  P Schulze Lammers  
Institution:a College of Information and Electrical Engineering, China Agricultural University, 100083 Beijing, China;b Institute of Agricultural Engineering, University of Kiel, 24098 Kiel, Germany;c Institute of Crop Science and Resource Conservation, University of Bonn, 53115 Bonn, Germany;d School of Technology, Beijing Forestry University, 100083 Beijing, China;e Department of Agricultural Engineering, University of Bonn, 53115 Bonn, Germany
Abstract:
Keywords:Sensor  Volumetric soil water content  Apparent electrical conductivity  Penetration resistance  Yield
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号