Introgression of hexaploid sources of crown rot resistance into durum wheat

Triticum turgidum ssp. durum (tetraploid durum) germplasm is very susceptible to crown rot, caused by the fungus Fusarium pseudograminearum. Screening activities to date have failed to identify even moderately susceptible lines. In contrast partial resistance to this disease has been identified in a number of Triticum aestivum (hexaploid wheat) lines, including 2-49 and Sunco. This study describes the successful introgression of partial crown rot resistance from each of these two hexaploid wheat lines into a durum wheat background. Durum backcross populations were produced from two 2-49/durum F₆ lines which did not contain any D-genome chromosomes and which had crown rot scores similar to 2-49. F₂ progeny of these backcross populations included lines with field based resistance to crown rot superior to that of the parent hexaploid wheat.