| 玉米秆表面的研究分析 |
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| 引用本文： | 陈桂华,姚斌,向仕龙,刘碧华. 玉米秆表面的研究分析[J]. 林产工业, 2007, 34(6): 23-25 |
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| 作者姓名： | 陈桂华 姚斌 向仕龙 刘碧华 |
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| 作者单位： | 中南林业科技大学,长沙,410004;湖南省质量技术监督局,长沙,410007 |
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| 基金项目： | 湖南省教育厅(04C690)项目部分内容 |
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| 摘 要： | 借助扫描电子显微镜和X射线能谱仪(SEM-EDAX)对玉米秆表面进行分析,结果表明:玉米秆表面较为平滑、致密,除H外,主要由C、O、Si三种元素组成,含Si量高达30%,其表面零星分布的块状物和棒状物则有较高的S和K含量。
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| 关 键 词： | 玉米秆 表面分析 扫描电镜-X射线能谱分析 |
| 文章编号： | 1001-5299(2007)06-0023-03 |
| 修稿时间： | 2007-03-02 |
Study on Corn Stalk Surface by Means of SEM-EDAX |
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| CHEN Gui-hua,YAO Bin,XIANG Shi-long,LI Bi-hua. Study on Corn Stalk Surface by Means of SEM-EDAX[J]. China Forest Products Industry, 2007, 34(6): 23-25 |
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| Authors: | CHEN Gui-hua YAO Bin XIANG Shi-long LI Bi-hua |
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| Abstract: | By means of SEM-EDAX,the property and element composition of corn stalk surface are studied.The results show that corn stalk surface is relatively smooth and dense.Besides the element H,the surface consists of three elements,i,e.C,O and Si.The Si content of corn stalk surface is about 30% of the total weight.The S and K content of the small swelling scattered on the surface is relative- ly high. |
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| Keywords: | Corn stalk Surface SEM-EDAX |
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