苹果砧木实生后代枝条电阻抗参数与抗寒性的相关性

以苹果砧木实生后代单株为试材，研究低温胁迫下苹果砧木实生后代枝条电阻抗（EIS）参数（胞外电阻率re、胞内电阻率ri、电阻率r1和弛豫时间τ）的变化，并分析电阻抗图谱法和常规的电导法测定的苹果砧木抗寒性的相关性。结果表明，随着温度降低，苹果砧木枝条的胞外电阻率re、胞内电阻率ri、电阻率r1和弛豫时间τ均减小。以苹果砧木枝条的EIS参数电阻率r1、胞外电阻率re、胞内电阻率ri求得的抗寒性与EL法测定的抗寒性呈显著性正相关（r=0.838～0.906）。r1测定的苹果砧木枝条的抗寒性与EL法测定的抗寒性相差10℃，不适合用于测定苹果砧木枝条的抗寒性。表明经低温胁迫后的苹果砧木枝条用re和ri可以测定苹果砧木枝条的抗寒性。

Effect of Low Temperature Stress on Electrical Impedance Spectroscopy Parameters of Apple Rootstocks

In this paper,the two-year-old seedlings of the apple rootstocks were used to analysis the changes of electrical impedance spectroscopy（EIS）parameters（r e,r i,r 1、,τ）and the relation between the frost hardiness（FH）by means of electrical impedance spectroscopy and conventional electrolyte leakage when shoots of apple rootstocks apple rootstocks under low temperature stress.The results showed that extracellular resistance（r e）,intracellular resistance（r i）the resistances（r 1）and relaxation time（τ）decreased with the temperature being reduced.For the frost-exposed stems,ther e,r i,andr 1 were highly correlated with the frost hardiness（r = 0.838-0.906）,butr 1 underestimated frost hardiness about 10℃.The results suggested thatr e andr i could be the suitable parameters to measure the frost hardiness of apple rootstocks freezing,and r e was the best parameter.