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一种抗鸟害水稻变异系颖壳SEM观察及硅含量分析
引用本文:姬生栋,王海莎,朱德来,侯磊磊,魏松浩,张翔宇,张羽,李春艳,马亚峰,郭丹丹. 一种抗鸟害水稻变异系颖壳SEM观察及硅含量分析[J]. 作物学报, 2012, 38(4): 725-731. DOI: 10.3724/SP.J.1006.2012.00725
作者姓名:姬生栋  王海莎  朱德来  侯磊磊  魏松浩  张翔宇  张羽  李春艳  马亚峰  郭丹丹
作者单位:河南师范大学生命科学学院, 河南新乡 453007
基金项目:国家转基因生物新品种培育重大专项(2008ZX08001-006);河南省重大科技专项(091100110402-01);河南省自然科学基金项目(092300410082)
摘    要:抗鸟害水稻材料是一种稀缺的种质资源, 研究其稻谷颖壳的表面结构(颖壳稃尖闭合程度, 稃毛的长度、直径和密度, 颖壳包裹米粒松紧度), 以及与颖壳机械强度和韧性相关的硅(Si)元素含量, 旨在为抗鸟害水稻新种质的开发利用和理论研究提供依据。利用扫描电镜和能谱技术, 观察分析了一种已稳定遗传至第10代的抗鸟害水稻变异品系和3个对照水稻品种稻谷颖壳表面的细胞结构和硅元素含量, 结果表明: (1) 变异品系颖壳稃尖闭合程度及颖壳的中上部稃毛长度、直径、密度均显著大于对照;(2) 对照颖壳与米粒之间的间隙明显大于变异品系;(3) 变异品系颖壳外表面的Si含量显著低于对照, 而内表面Si含量明显高于对照, 内外表面Si含量之差明显低于对照。说明抗鸟害水稻材料的稻谷颖壳表面结构和硅元素含量与普通水稻存在显著差异, 为培育抗鸟害水稻新品种提供了有用指标。

关 键 词:水稻  颖壳  扫描电镜  能谱  
收稿时间:2011-09-26

Observation by Scanning Electron Microscope (SEM) and Analysis of Silicon Content on Glume of Rice Variant Strain with Bird Disaster Resistance
JI Sheng-Dong , WANG Hai-Sha , ZHU De-Lai , HOU Lei-Lei , WEI Song-Hao , ZHANG Xiang-Yu , ZHANG Yu , LI Chun-Yan , MA Ya-Feng , GUO Dan-Dan. Observation by Scanning Electron Microscope (SEM) and Analysis of Silicon Content on Glume of Rice Variant Strain with Bird Disaster Resistance[J]. Acta Agronomica Sinica, 2012, 38(4): 725-731. DOI: 10.3724/SP.J.1006.2012.00725
Authors:JI Sheng-Dong    WANG Hai-Sha    ZHU De-Lai    HOU Lei-Lei    WEI Song-Hao    ZHANG Xiang-Yu    ZHANG Yu    LI Chun-Yan    MA Ya-Feng    GUO Dan-Dan
Affiliation:College of Life Sciences, Henan Normal University, Xinxiang 453007, China
Abstract:Bird-disaster-resistant rice is a kind of scarce germplasm resources, and the research on its glume surface structure, such as the close degree of glume tip, the length, diameter and density of pubescence, as well as the silicon (Si) content related with glume mechanical strength could provide a theoretical basis for the exploitation and utilization of the bird-resistant rice variants. In the present research, the surface structure and silicon (Si) content of glumes of a stably inherited bird-resistant variant of rice (the 10th generation) were investigated via scanning electron microscopy (SEM) and energy spectrum technology. Compared with three control strains, the length, diameter and density of pubescence on the upper middle section of glume as well as the close degree of glume tip were significantly greater for the variant, and the interspaces between glumes and grains were significantly smaller. The variant showed a higher Si content in the outer surface of glume than the three controls, while a lower content in their inner surface. These results indicate that the characteristics of the bird-disaster-resistant variant of rice are significantly associated with the surface structure and its Si content of glume, and the results are also useful for developing and utilizing new.
Keywords:Rice  Glume  Scanning electron microscopy  Energy spectrum  Silicon
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