Ultrathin carbon support films for electron microscopy |
| |
Authors: | R C Williams R M Glaeser |
| |
Abstract: | Carbon support films only 4 to 6 angstroms thick have been made for use in electron microscopy. The determination of their thickness is based on geometrical calculation, electron scattering measurements, and elemental microanalysis. |
| |
Keywords: | |
|
|