Prediction of parental combination for introduction of stay-green associated loci in wheat |
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| Authors: | Henrique de Souza Luche José Antonio Gonzalez da Silva Rafael Nornberg Emilio Ghisleni Arenhardt Vanderlei da Rosa Caetano Luciano Carlos da Maia Antonio Costa de Oliveira |
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| Institution: | 1.DuPont Pioneer,Sorriso-MT,Brazil;2.Department of Agrarian Studies,Regional University of the Northwest of Rio Grande do Sul,Ijuí,Brazil;3.OR Seeds,Passo Fundo-RS,Brazil;4.Department of Crop Plants,Federal University of Rio Grande do Sul,Porto Alegre,Brazil;5.Embrapa Temperate Agriculture,Pelotas-RS,Brazil;6.Center for Genomics and Plant Breeding, Faculty of Agronomy Eliseu Maciel,Federal University of Pelotas,Pelotas,Brazil;7.Center for Genomics and Plant Breeding, Faculty of Agronomy Eliseu Maciel,Federal University of Pelotas,Pelotas,Brazil |
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| Abstract: | In wheat, the increase of yield and stability associated traits can be achieved by combining parents containing the stay-green trait and favorable alleles for grain yield. The aim of this work was to analyze the genetic dissimilarity between wheat lines from stay-green and synchronized maturation groups and elite cultivars. Moreover, to propose promising combinations seeking the selection of high-grain yield and high bread-making quality genotypes containing stay-green trait. The experiment was conducted in a randomized block design with three replications in 2003, 2004, and 2005, using sister-lines with the presence and absence of stay-green trait and elite cultivars. Genetic variability exists among wheat strains from the synchronized stay-green maturation group and elite cultivars. Genotypes of maturation group stay-green obtained an average performance superior to the synchronized group. Crosses between stay-green lines and the CEP 29 and BRS 177 cultivars are promising in the selection of genotypes carrying the stay-green trait with high yield and bread-making quality. |
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