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Design of nondestructive examination system for bridge cables surface defect
Authors:GUO Yong cai  LI Zhe and GO Chao
Institution:Key Laboratory of Optoelectronic Technology and Systems,Ministry of Education,Chongqing University,Chongqing 400044,P.R. China;Key Laboratory of Optoelectronic Technology and Systems,Ministry of Education,Chongqing University,Chongqing 400044,P.R. China;Key Laboratory of Optoelectronic Technology and Systems,Ministry of Education,Chongqing University,Chongqing 400044,P.R. China
Abstract:Aiming at the drawbacks of the current detecting methods, a nondestructive examination system design for bridge cables based on high speed digital signal processors chip DM642 is presented, and the hardware platform of the system is built. This examination system mainly consists of four parts: the image defaults acquisition part, DM642 hardware platform, creeping part and defaults locating equipment. The designed system is tested on the hardware platform based on digital image processing algorithm. The experimental results show that the detecting system has the advantages of high stability and reliability, real time, mass storage, and nondestructive examination, etc. This system uses high technology and has significant meaning on detecting the current bridge cables health, furthermore, this method can be used in other examination fields.
Keywords:digital signal processors  bridge cables  nondestructive examination
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