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Characterization and Molecular Mapping of a Stripe Rust Resistance Gene in Synthetic Wheat CI110 |
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| Authors: | REN Qiang LIU Hui-juan ZHANG Zeng-yan FENG Jing XU Shi-chang PU Zong-jun XIN Zhi-yong |
| Affiliation: | 1. The National Key Facility for Crop Gene Resources and Genetic Improvement/Key Laboratory of Biology and Genetic Improvement of Triticeae Crops, Ministry of Agriculture/Institute of Crop Sciences, Chinese Academy of Agricultural Sciences, Beijing 100081, P.R. China 2. Institute of Plant Protection, Chinese Academy of Agricultural Sciences, Beijing 100193, P.R.China 3. Crop Research Institute, Sichun Academy of Agricuttural Sciences, Chengdu 610066, P.R.China |
| Abstract: | |
| Keywords: | synthetic wheat Puccinia striiformis f. sp. tritici resistance gene simple sequence repeat (SSR) marker gene postulation |
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