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苦瓜枯萎病抗性材料 Thai4-6 的遗传模型分析
引用本文:刘子记,朱婕,牛玉,杨衍.苦瓜枯萎病抗性材料 Thai4-6 的遗传模型分析[J].热带作物学报,2018,39(8):1501-1506.
作者姓名:刘子记  朱婕  牛玉  杨衍
作者单位:1中国热带农业科学院热带作物品种资源研究所;  2海南大学热带农林学院
摘    要:苦瓜枯萎病是尖孢镰刀菌苦瓜专化型引起的真菌病害,探明苦瓜枯萎病的抗性遗传机制对制定抗病育种策略具有现实指导意义。本文以抗枯萎病苦瓜材料 Thai4-6 和感病材料 CN19-1 为亲本配制杂交组合,基于该组合 6 世代遗传群体(P1、P2、F1、F2、BCP1 和 BCP2),采用主基因+多基因混合遗传模型分析枯萎病抗性遗传特性。 数据分析结果表明,该杂交组合的枯萎病抗性呈连续分布,最适模型为 2 对加性-显性-上位性主基因+加性-显性多 基因遗传模型(E-1),2 对主基因加性效应值均为–13.85,显性效应值分别是 25.58 和 34.26,主基因遗传率在 BCP1、 BCP2 和 F2 中分别是 86.03%、80.34%和 94.25%,表明该组合枯萎病抗性主要受 2 对主基因控制。环境因素引起的 变异在 3 个分离世代群体中分别占 13.97%、14.06%和 5.75%。本研究可为抗枯萎病苦瓜育种提供理论依据。

关 键 词:苦瓜  混合遗传模型  枯萎病抗性  遗传分析  

Genetic Model Analysis of Wilt Resistance in Bitter Gourd Germplasm Thai4-6
LIU Ziji,ZHU Jie,NIU Yu,YANG Yan.Genetic Model Analysis of Wilt Resistance in Bitter Gourd Germplasm Thai4-6[J].Chinese Journal of Tropical Crops,2018,39(8):1501-1506.
Authors:LIU Ziji  ZHU Jie  NIU Yu  YANG Yan
Institution:1Tropical Crops Genetic Resources Institute, Chinese Academy of Tropical Agricultural Sciences; 2Institute of Tropical Agriculture and forestry, Hainan University
Abstract:Bitter gourd wilt is a fungus disease caused by Fusarium oxyspoorum Schl. f. sp. momodicae Sun & Huang.  Exploring resistance mechanism has practical guiding significance for wilt resistance breeding of bitter gourd. Crosses had been made between bitter gourd line Thai4-6, high resistant to fusarium wilt and CN19-1, high susceptible to fusarium wilt. The inheritance of fusarium wilt resistance was analyzed with P1, P2, F1, BCP1, BCP2 and F2 populations through employing the major gene plus polygene mixed inheritance model. The results showed that the wilt resistance in the populations of F2, BCP1, and BCP2 was a continuous distribution. The most suitable model was E-1 model, two major genes with additive-dominance-epistasis effects plus polygenes with additive-dominance effects. The additive effect of the 2 major genes was –13.85 and the dominance effect was 25.58 and 34.26, respectively. The heritability value of he major genes in BCP1, BCP2, and F2 was 86.03%, 80.34% and 94.25%, respectively. The results showed that the wilt resistance was mainly controlled by 2 major genes. The environmental variation in BCP1, BCP2, and F2 accounted for 13.97%, 14.06% and 5.75%, respectively. This study could provide a theoretical basis for the wilt resistance breeding of bitter gourd.
Keywords:bitter gourd  wilt resistance  mixed genetic model  genetic analysis  
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