首页 | 本学科首页   官方微博 | 高级检索  
     检索      

小麦F4代株系的DNA位点纯合率和农艺性状变异幅度
引用本文:王丽霞,王立新,季伟,李宏博,信爱华,常利芳,魏建民,赵昌平.小麦F4代株系的DNA位点纯合率和农艺性状变异幅度[J].分子植物育种,2009,7(4):703-708.
作者姓名:王丽霞  王立新  季伟  李宏博  信爱华  常利芳  魏建民  赵昌平
作者单位:1. 内蒙古农业大学生物工程学院,呼和浩特,010018
2. 北京市农林科学院,北京杂交小麦工程技术研究中心,北京,100097
基金项目:北京市农业育种基础研究创新平台项目Ⅱ,国家科技支撑计划子课题项目 
摘    要:近年来,我国部分育种者为了加快小麦育种速度而缩短系统选择年限,用F4代株系进行品种比较试验,并将其作为品种参加区域试验.本研究以10个小麦杂交组合F4代株系及其亲本为试验材料,对不同株系及其亲本的DNA位点纯合率和重要农艺性状的稳定性进行研究.结果表明,10个F4代株系的DNA位点纯合率在83.0%~94.8%之间,其亲本的DNA位点纯合率均高于95%.以DNA位点纯合率≥95%的品种为对照,10个F4代株系中仅BF-2003-82-17的农艺性状变异幅度在对照品种的变异范围之内,其DNA位点纯合率为94.2%,接近95%.其余9个F4代株系均有变异幅度大于对照品种或仍在分离的农艺性状,初步证明大多数F4代株系的一致性和稳定性尚不符合要求,只有极少数株系具备了一致性和稳定性.

关 键 词:小麦  DNA位点纯合率  农艺性状  一致性  稳定性

The Homozygous DNA Locus Ratio and the Variation Range of Agronomic Traits of Wheat F4 Lines
Wang Lixia,Wang Lixin,Ji Wei,Li Hongbo,Xin Aihua,Chang Lifang,Wei Jianmin,Zhao Changping.The Homozygous DNA Locus Ratio and the Variation Range of Agronomic Traits of Wheat F4 Lines[J].Molecular Plant Breeding,2009,7(4):703-708.
Authors:Wang Lixia  Wang Lixin  Ji Wei  Li Hongbo  Xin Aihua  Chang Lifang  Wei Jianmin  Zhao Changping
Institution:Wang Lixia 2 Wang Lixin 1 Ji Wei 1 Li Hongbo 1 Xin Aihua 1 Chang Lifang 1 Wei Jianmin 2 Zhao Chang- ping 1 1 Beijing Academy of Agriculture , Forestry Sciences,Beijing Engineering , Technique Research Center for Hybrid Wheat,Beijing,100097,2 Biology Engineering Institute of Inner Mongolia Agriculture University,Hohhot,010018
Abstract:In order to shorten breeding time, some wheat breeders used F4 lines as cultivars to carry out comparison tests and submit them to wheat cultivar regional tests. In this study, ten of F4 lines and their parents were employed to detect the homozygous DNA locus ratio and the uniformity as well as the stability of main agronomic traits. The results showed that the homozygous DNA locus ratios of ten of F4 lines were 83.0%~94.8%. The ratios of their parents were higher than 95%. The variation range of agronomic ...
Keywords:
本文献已被 CNKI 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号