首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Breeding and genetic studies of tolerance to several bean (Phaseolus vulgaris L.) bacterial pathogens
Authors:D P Coyne  M L Schuster
Institution:(1) University of Nebraska, Lincoln, Nebraska, USA
Abstract:Summary A breeding and genetic program to develop Phaseolus vulgaris bean varieties tolerant to the bacterial pathogens Pseudomonas phaseolicola, Xanthomonas phaseoli and Corynebacterium flaccumfaciens was conducted from 1962 to the present tme. The research progress is reported. Great Northern (GN) Nebraska #1, sel. 27 and PI 150414 dry bean lines were highly tolerant to races 1 and 2 of the halo blight bacterium (P. phaseolicola). The tolerant inoculated leaf, pod, and non-systemic chlorosis reactions to this bacterium were each controlled by different major genes. Coupling linkage was detected between genes controlling the leaf and systemic chlorosis reactions. GN Nebraska #1, sel. 27 and PI 207262 were tolerant to isolates (USA) of X. phaseoli, causal pathogen of common blight disease. Reaction to this bacterium was inherited quantitatively. Narrow sense heritability estimates of the disease reaction were low. Genes controlling late maturity and tolerant reaction were found to be linked in crosses with GN Nebraska #1, sel. 27 but linkage was not apparent in one cross with PI 207262. A different reaction of pod and foliage was observed in some bean lines. Susceptibility increased with the onset of plant maturity. PI 165078 was tolerant to C. flaccumfaciens and the disease reaction was simply inherited. The dry bean varieties lsquoGN Tararsquo and lsquoGN Julesrsquo, tolerant X. phaseoli, and lsquoGN Emersonrsquo tolerant to C. flaccumfaciens and X. phaseoli were released in recent years. Breeding approaches to develop bean varieties tolerant to these bacterial pathogens is discussed.Published as Paper No. 3711, Journal Series, Nebraska Agricultural Experiment Station. Research was conducted under Project No. 20-3.
Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号