Evaluation of Parameters Accounting for Phomopsis Resistance Using Natural Infection and Artificial Inoculation on Recombinant Inbred Lines From a Cross Between Susceptible and Resistant Sunflower

HA89, a sunflower line susceptible to Phomopsis, was crossed with a resistant line, LR4-17. Two hundred and forty-one F2/F3 progenies and 232 recombinant inbred (RI) lines were derived from this cross. F2/F3 progenies were tested in semi-natural infections in 1994. F7, F8 and F9 were tested with semi-natural infections in 1997, 1998 and 1999, respectively. F7 RI lines were artificially infected with Phomopsis mycelium on leaves in 1997. Family effects were significant in F2/F3 progenies for attack rates on stems and encircling spots rates on stems after semi-natural infections. Line effects were significant for attack rates on stems and encircling spot rates in F7 and F8. F7 RI lines showed a high heritability for speed of necrosis on leaf blades after artificial infection. Continuous and unimodal distributions were observed for attack rates on stems in all experiments done in semi-natural conditions. In contrast, speed of necrosis on leaf blades showed a bimodal distribution. Significant rank correlations were observed between the speed of necrosis on leaf blades and the attack rates on stems. It is suggested that resistance to Phomopsis is the consequence of several mechanisms, independently inherited. It was concluded that speed of necrosis on leaf blades in artificial infections and attack rates on stems in natural infections should be retained as parameters for quantitative trait locus mapping of Phomopsis resistance.