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A dielectric omnidirectional reflector
Authors:Y Fink  JN Winn  S Fan  C Chen  J Michel  JD Joannopoulos  EL Thomas
Institution:Y. Fink, Department of Material Science and Engineering and Plasma Science and Fusion Center, Massachusetts Institute of Technology, Cambridge, MA 02139, USA. J. N. Winn, S. Fan, J. D. Joannopoulos, Department of Physics, Massachusetts Institute.
Abstract:A design criterion that permits truly omnidirectional reflectivity for all polarizations of incident light over a wide selectable range of frequencies was used in fabricating an all-dielectric omnidirectional reflector consisting of multilayer films. The reflector was simply constructed as a stack of nine alternating micrometer-thick layers of polystyrene and tellurium and demonstrates omnidirectional reflection over the wavelength range from 10 to 15 micrometers. Because the omnidirectionality criterion is general, it can be used to design omnidirectional reflectors in many frequency ranges of interest. Potential uses depend on the geometry of the system. For example, coating of an enclosure will result in an optical cavity. A hollow tube will produce a low-loss, broadband waveguide, whereas a planar film could be used as an efficient radiative heat barrier or collector in thermoelectric devices.
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