首页 | 本学科首页   官方微博 | 高级检索  
     

浅谈减少击穿现象
引用本文:王洪媛,李雪莲,陈新欣,李志华. 浅谈减少击穿现象[J]. 湖南农机, 2012, 39(3): 250+252
作者姓名:王洪媛  李雪莲  陈新欣  李志华
作者单位:天津市引滦工程尔王庄管理处,天津,301802
摘    要:现实中工程师设计降压转换器时经常忽视“击穿”的问题,文章结合实际经验分析总结,对“击穿”现象提出了几点改造意见,经过实践效果很好,总结在此予以交流共享.

关 键 词:击穿  MOSFET  驱动器芯片

Talking about reducing the breakdown phenomenon
WANG Hong-yuan , LI Xue-lian , CHEN Xin-xin , LI Zhi-hua. Talking about reducing the breakdown phenomenon[J]. Hunnan Agricultural Machinery, 2012, 39(3): 250+252
Authors:WANG Hong-yuan    LI Xue-lian    CHEN Xin-xin    LI Zhi-hua
Affiliation:(Luan River Project Erwangzhuang Management Office,Tianjin 301802,China)
Abstract:The reality of the engineer to design the step-down converter is often overlooked "breakdown" of the problem,we analyzed and summarized,combined with practical experience and some transformation of the views of the " breakdown" phenomenon,after practice,the effect of good,to be summarized in this exchange and sharing.
Keywords:breakdown  the MOSFET  driver chip
本文献已被 CNKI 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号