首页 | 本学科首页   官方微博 | 高级检索  
     


Estimating the Risk of Exceeding Thresholds in Environmental Systems
Authors:Elena M. Bennett  Stephen R. Carpenter  Jeffrey A. Cardille
Affiliation:1. Center for Limnology, University of Wisconsin, 680 N. Park St., Madison, WI, 53706, USA
3. Department of Natural Resource Sciences and McGill School of Environment, McGill University, 21,111 Lakeshore Rd., Ste. Anne de Bellevue, Quebec, H9X 3V9, Canada
2. Department of Zoology, University of Wisconsin, 430 Lincoln Drive, Birge Hall, Madison, WI, 53706, USA
4. Département de Géographie, Université de Montréal, C.P. 6128 succursale centre-villeMontréal, Quebec, H3C 3J7, Canada
Abstract:Environmental regulations often rely on limits or thresholds to indicate an acceptable pollutant load. Estimates of the Risk of Exceeding such Thresholds (RET) are often based on a single model deemed to be the best for the particular pollutant or particular case. However, if many models make different predictions but explain the data almost equally well, predictions based on a single model may omit important information contained in other models that fit almost as well as the “best” single model. More accurate assessments of RET may result if multiple models are considered. We compared performance of the single best model relative to that of an ensemble of models estimated by bagging (Bootstrap AGGregatING) using the example of soil P concentrations and the risk of exceeding environmental limits of soil P concentrations in the watershed of Lake Mendota, Wisconsin, USA. Bagging yielded significantly better predictions of the risk of exceeding a threshold level of soil P (99.6% accuracy versus 74% for single-model prediction at a 20 mg kg?1 threshold). Use of multiple model techniques can improve estimates of RET over a range of realistic thresholds in other management situations where thresholds are important including eutrophication, desertification, fisheries, and many types of pollution control.
Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号