| Abstract: | Modification of an existing single kernel wheat characterization system allowed collection of visible and near-infrared (NIR) reflectance spectra (450–1,688 nm) at a rate of 1 kernel/4 sec. The spectral information was used to classify red and white wheats in an attempt to remove subjectivity from class determinations. Calibration, validation, and prediction results showed that calibrations using partial least squares regression and derived from the full wavelength profile correctly classed more kernels than either the visible region (450–700 nm) or the NIR region (700–1,688 nm). Most results showed >99% correct classification for single kernels when using the visible and NIR regions. Averaging of single kernel classifications resulted in 100% correct classification of bulk samples. |
