Evaluation of breeding strategies for resistance and tolerance to late blight in potato by means of simulation |
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Authors: | M. Van Oijen |
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Affiliation: | (1) Centre for Plant Breeding and Reproduction Research (CPRO-DLO), Wageningen, the Netherlands;(2) Present address: Centre for Agrobiological Research (CABO-DLO), P.O. Box 14, 6700 AA Wageningen, the Netherlands |
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Abstract: | A field experiment with three potato cultivars, where plants were inoculated withPhytophthora infestans, was used to parameterize a model of potato growth and blight population dynamics. The model was validated by accurately simulating a field experiment conducted in another year. Sensitivity analysis with the model showed that late cultivars are longer able to maintain a green canopy in the presence of disease, but still suffer more yield loss than early cultivars. The level of partial resistance of a cultivar was more important than its level of tolerance, and other plant characteristics. The model calculations showed that only between 4 and 15% of the yield loss in the experiments was due to accelerated leaf senescence caused by the disease; the major part of the loss was caused by lesion coverage of leaves. |
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Keywords: | Phytophthora infestans accelerated senescence light interception yield model |
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