Studying soil-ground thickness by means of new electroinvestigation technologies

A new approach to interpreting the data from vertical electrical probing (VEP) of soil-ground thickness has been approved for soil investigations. Formulas for the calculation of the electric resistance (ρ _i ) of layers of soil thickness were developed based on an electric current passing through heterogeneous earth and on an unconventional solution of the Laplace equation. The ρ _i of the layers was calculated and the capacity and the boundaries of separation where revised as well, using the intensities of the peculiarities, viz., lithology, natural composition, water content, salting, etc. The ρ _i values that were calculated according to the proposed formulas using the VEP data and also the laboratory measurements of this value ρ _i in soil-ground samples correlate very well. The proposed methodology is more informative in comparison with traditional ones, especially with the IPI2win program.