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大功率P沟道VDMOS器件设计与工艺仿真
引用本文:蒲石,杜林,张得玺.大功率P沟道VDMOS器件设计与工艺仿真[J].保鲜与加工,2016(4):133-138.
作者姓名:蒲石  杜林  张得玺
作者单位:西安电子科技大学 宽禁带半导体材料与器件教育部重点实验室, 西安 710071,西安电子科技大学 宽禁带半导体材料与器件教育部重点实验室, 西安 710071,西安电子科技大学 宽禁带半导体材料与器件教育部重点实验室, 西安 710071
基金项目:国家自然科学基金资助项目(61106106);中央高校基本科研业务费专项基金(K5051325002,K50511250008)。
摘    要:作为现代电力电子核心器件之一的P沟道VDMOS (vertical double-diffuse,MOS)器件,一直以来由于应用领域狭窄而并未得到足够的研究。以P沟道VDMOS器件为研究对象,为一款击穿电压超过-200 V的P沟道VDMOS设计了有源区的元胞结构及复合耐压终端结构,并开发了一套完整的P沟道VDMOS专用非自对准工艺流程。最后通过仿真得到器件的击穿电压超过-200 V,阈值电压为-2.78 V,完全满足了设计要求,也为下一步流片提供了有益的参考。

关 键 词:P沟道VDMOS  击穿电压  导通电阻  阈值电压
收稿时间:2015/3/25 0:00:00

Design and process simulation of high voltage P-channel VDMOS
PU Shi,DU Lin and ZHANG Dexi.Design and process simulation of high voltage P-channel VDMOS[J].Storage & Process,2016(4):133-138.
Authors:PU Shi  DU Lin and ZHANG Dexi
Institution:Key Laboratory for Wide Band-gap Semiconductor Materials and Devices, Ministry of Education, Xidian University, Xi''an 710071, P. R. China,Key Laboratory for Wide Band-gap Semiconductor Materials and Devices, Ministry of Education, Xidian University, Xi''an 710071, P. R. China and Key Laboratory for Wide Band-gap Semiconductor Materials and Devices, Ministry of Education, Xidian University, Xi''an 710071, P. R. China
Abstract:As one of core devices in modern power semiconductor, P-channel VDMOS device has not been well researched for its narrow applications. We focused on the development of P-channel VDMOS device, designed a P-channel VDMOS with breakdown voltage over -200 V, including the active region cell structure and the junction termination structure, and developed a non-self-aligned progress flow for P channel VDMOS. Simulation results show that the breakdown voltage of the device is over -200 V and the threshold voltage is -2.78 V. The results meet the design requirements, and the research can provide references for the device fabrication.
Keywords:P-channel VDMOS  breakdown voltage  on-resistance  threshold voltage
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