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Characterization of refractory organic substances by NEXAFS using a compact X-ray source

Authors:	Julia Sedlmair Sophie-Charlotte Gleber Christian Peth Klaus Mann Jürgen Niemeyer Jürgen Thieme

Institution:	(1) Institute for X-Ray Physics, Georg-August-University G?ttingen, Friedrich-Hund-Platz 1, 37077 G?ttingen, Germany;(2) Argonne National Laboratory, APS, 9700 S. Cass Avenue, Building 401, Argonne, IL 60439–4837, USA;(3) Institut f?r Laser- und Plasmaphysik, Heinrich-Heine-University D?sseldorf, Universit?tsstr. 1, 40225 D?sseldorf, Germany;(4) Laser-Laboratorium G?ttingen e.V., Hans-Adolf-Krebs-Weg 1, 37077 G?ttingen, Germany;(5) Institute for Applied Biotechnology, Georg-August-University G?ttingen, Marie-Curie-Str. 7, 37074 G?ttingen, Germany;(6) Brookhaven National Laboratory, NSLS II, Building 817, Upton, NY 11973, USA

Abstract:	Purpose We present the characterization of environmental samples using near-edge X-ray absorption fine structure (NEXAFS) spectra recorded with an in-house device. We want to point out the feasibility of such an easily accessed complementary technique, if not sometimes alternative to NEXAFS studies performed with synchrotron radiation, as the number of compact setups is increasing.

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