首页 | 本学科首页   官方微博 | 高级检索  
     


Genetic analysis of resistance to late leaf spot in interspecific groundnuts
Authors:Janila Pasupuleti  Venuprasad Ramaiah  Abhishek Rathore  Aruna Rupakula  R. Kanaka Reddy  Farid Waliyar  Shyam Narayan Nigam
Affiliation:1. International Crops Research Institute for the Semi-Arid Tropics, Hyderabad, Andhra Pradesh, India
Abstract:Late leaf spot (LLS), caused by Phaeoisariopsis personata, is an important foliar fungal disease of groundnut (Arachis hypogaea L.), which causes significant economic losses globally to the crop. Inheritance of resistance to LLS disease was studied in three crosses and their reciprocals involving two resistant interspecific derivatives and a susceptible cultivar to refine strategy for LLS resistance breeding. The traits associated with LLS resistance, measured both in the field and under controlled conditions were studied following generation mean analysis. Results suggested that resistance to LLS is controlled by a combination of both, nuclear and maternal gene effects. Among nuclear gene effects, additive effect controlled majority of the variation. In JL 24 × ICG 11337 cross and its reciprocal only additive effects were important, while in JL 24 × ICG 13919 cross and its reciprocal, both additive and dominance effects contributed to the variation. Among digenic epistatic effects, additive × dominance interactions were significant. Additive–maternal effects were significant in both the crosses, while dominance–maternal effects also contributed to the variation in the crosses between the parents, JL 24 and ICG 13919. Due to significant contribution of additive effects of both nuclear and maternal inheritance to resistance to LLS, the parent, ICG 11337 would be a good donor in breeding programs. It would be worthwhile to use the resistance donor as female parent to tap maternal effects of resistance to LLS. Disease score is the best selection criterion in the field for use in breeding programs because of its high heritability and ease in measurement.
Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号