小麦苗期和灌浆中期根系性状与地上形态及产量性状的相关性

为探究小麦根系性状与地上形态及产量性状的关系,促进小麦根系性状的改良,本研究选用48个遗传背景丰富的冬小麦品种,用室内卷纸法测定小麦苗期根系性状,用电容法测定小麦灌浆中期根系电容值,并利用大田挖掘法测定13个苗期根系差异较大的小麦品种灌浆中期的总根长、总根表面积和总根体积等根系性状,分析小麦根系性状与地上部形态及产量性...

Correlation Study on Root Traits and Shoot Morphology,Yield Traits of Wheat at Seedling and Mid-Grain Filling Stage

In order to study the relationship between wheat root traits and shoot morphology, yield traits, and to promote the improvement of wheat root traits,we selected 48 winter wheat varieties with rich genetic background and measured the root traits of wheat at seedling stage by indoor paper rolling method and root electrical capacitance value at mid-grain filling stage by electrical capacitance method.The root traits were determined at mid-grain filling stage of 13 wheat varieties with large differences in the root system at seedling stage.The relationship between wheat root traits and shoot morphology,and yield traits was analyzed. In summary, our study suggested that the electrical capacitance value of the wheat root system at mid-grain filling stage was significantly positively correlated with the root traits at seedling stage, and was significantly positively correlated with total root length and total root surface area at mid-grain filling stage. Further analysis showed that the electrical capacitance value of the wheat root system at mid-grain filling stage was significantly positively correlated with plant height, peduncle length and flag leaf length, and significantly negatively correlated with flag leaf width. The electrical capacitance value of the wheat root system at mid-grain filling stage was significantly positively correlated with spikelet number per spike, thousand-grain weight and yield per plant. The wheat varieties were divided into three categories including by root electrical capacitance value. There were significant differences between wheat varieties with high and low electrical capacitance values in the above-mentioned agronomic traits.The root trait at seedling stage of wheat and the root electrical capacitance value at mid-grain filling stage of wheat have high correlation with thousand-grain weight and spikelet number per spike. In summary, wheat root electrical capacitance value can better reflect the root traits of wheat in the late stage of growth.The shoot morphology,and yield traits which are significantly related to root electrical capacitance value, such as plant height, spikelet number per spike and thousand-grain weight, can be considered as alternative traits of wheat root traits.