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Juthaporn Khampila Kamol Lertrat Weerasak Saksirirat Jirawat Sanitchon Nooduan Muangsan Piyada Theerakulpisut 《Euphytica》2008,164(3):615-625
Exserohilum turcicum causes northern corn leaf blight (NCLB), an important disease occurring in maize producing areas throughout the world. Currently,
the development of cultivars resistant to E. turcicum seems to be the most efficient method to control NCLB damage. Marker-assisted selection (MAS) enables breeders to improve
selection efficiency. The objective of this work was to identify random amplified polymorphic DNA (RAPD) and sequence characterized
amplified region (SCAR) markers associated with NCLB resistance. Bulked segregant analysis (BSA) was used to search for RAPD
markers linked to NCLB resistance genes, using F2 segregating population obtained by crossing a susceptible inbred ‘209W’ line with a resistant inbred ‘241W’ line. Two hundred
and twenty-two decamer primers were screened to identify four RAPD markers: OPA07521, OPA16457, OPB09520, and OPE20536 linked to NCLB resistance phenotype. These markers were converted into dominant SCAR markers: SCA07496, SCA16420, SCB09464, and SCE20429, respectively. The RAPD and SCAR markers were developed successfully to identify NCLB resistant genotypes in segregating
progenies carrying NCLB resistant traits. Thus, the markers identified in this study should be applicable for MAS for the
NCLB resistance in waxy corn breeding programs. 相似文献
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