Relationship of plant height and days to maturity with resistance to spot blotch in wheat

A total of 1,407 spring wheat (T. aestivum) lines of Indian and CIMMYT (International Maize and Wheat Improvement Centre, Mexico) origin were evaluated for plant height, days to maturity and resistance to spot blotch (caused by Bipolaris sorokiniana) during the 1994–95, 1995–96 and 1996–97 crop seasons. The frequency distribution of genotypes, based on disease score ignoring the growth stages, differed from the distribution in which disease score was assessed on a similar growth stage. Two crosses each,between `tall resistant × dwarf susceptible' and `late resistant × early susceptible' genotypes, were made. The evaluation of homozygous resistant lines in the F₃, F₄ and F₅ generations of both crosses showed a wide range of plant height and days to maturity. These lines showed significant differences for plant height and days to maturity but did not show a significant difference for AUDPC values of spot blotch. The correlation coefficients for AUDPC versus plant height or days to maturity were weak, i.e., – 0.336 and 0.061, respectively. Results indicated that resistance to spot blotch severity was independent of plant height and days to maturity in progenies from these crosses.     

Genetic variations and population level admixture assessment for conservation planning of endangered Zanthoxylum armatum DC. in Western Himalaya

Genetic Resources and Crop Evolution - Zanthoxylum armatum DC. (Family Rutaceae) is an important species gaining tremendous popularity owing to its multiple uses in diverse medicine systems. The...