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221.
Fish mortality due to acute ammonia exposure 总被引:2,自引:0,他引:2
J. V. TARAZONA MJ. MUOZ J. A. ORTIZ MO. NUNÉZ J. A. CAMARGO 《Aquaculture Research》1987,18(2):167-172
Abstract. Fish mortality in the River Umia, near Villagarcia de Arosa, Pontevedra, Spain, which occurred after a discharge from a food sewage works, is studied. Physico-chemical parameters of water samples from sewage and from the River Umia were studied and concentrations of ammonia sufficiently high to cause toxic effects in fish (702 mg/1 and 302 mg/1 as total ammonia) were found. The toxicity of two concentrations of ammonia was investigated on goldfish, Carassius auratus (L.), using water quality values the same as found in the River Umia, to obtain the same concentrations of un-ionized ammonia (2·13 mg/1 and 0·91 mg/1). Fish exposed to high concentrations died within 24 h and three of six, which were exposed to the lowest concentration died within 96h. All fish at first showed symptoms of hyper excitability and hyperventilation, and at times of rest showed a decrease in respiration. Post-mortem findings generally included gill congestion and haemorrhage. 相似文献
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MJ Yoo TA Fulton HF Hess RL Willett LN Dunkleberger RJ Chichester LN Pfeiffer KW West 《Science (New York, N.Y.)》1997,276(5312):579-582
A single-electron transistor scanning electrometer (SETSE)-a scanned probe microscope capable of mapping static electric fields and charges with 100-nanometer spatial resolution and a charge sensitivity of a small fraction of an electron-has been developed. The active sensing element of the SETSE, a single-electron transistor fabricated at the end of a sharp glass tip, is scanned in close proximity across the sample surface. Images of the surface electric fields of a GaAs/AlxGa1-xAs heterostructure sample show individual photo-ionized charge sites and fluctuations in the dopant and surface-charge distribution on a length scale of 100 nanometers. The SETSE has been used to image and measure depleted regions, local capacitance, band bending, and contact potentials at submicrometer length scales on the surface of this semiconductor sample. 相似文献