Location-Specific and Across-Location Selections for Seed Yield in Populations of Common Bean, Phaseolus vulgaris L.

Two populations of common bean, Phaseolus vulgaris L., were used to make three independent location-specific selections at Palmira, Quilichao, and Popayán, Colombia. Also, three across-location selections were made by alternating generations between Palmira and Popayan, between Quilichao and Popayán, and among Palmira, Quilichao, and Popayán. The seven highest yielding lines selected from each environment and population along with 14 parents and two checks were evaluated for seed yield, seed weight, maturity, and reaction to an-thracnose, angular leaf spot, and common bacterial blight. Mean squares due to evaluation and selection environments, selected lines, and their interactions were significant for all traits. Mean yields of selected lines were higher than the mean of parents in both populations. Among location-specific selections, lines yielded higher at their respective selection site. Moreover, selections made at Popayán were higher yielding than those made at Quilichao or Palmira when tested across locations and years. Use of Popayán, a relatively wetter and cooler site, either alone or in combination with other locations resulted in higher yield, higher seed weight, and higher resistance to anthracnose. On the average, location-specific selections were lower yielding than the across-location selections. Among across-location selections, those selected between Palmira and Popayán were the highest yielding in both populations. Selections at Palmira and across all three locations resulted in greater stability.     

Comparison of two crossing and four selection schemes for yield, yield traits, and slow rusting resistance to leaf rust in wheat

The most important breeding objectives in crop improvement are improving grain yield, grain quality, and resistances to various biotic and abiotic stresses. The objectives of our study were to compare two crossing and four selection schemes for grain yield, yield traits, and slow rusting resistance to leaf rust (Puccinia recondita) based on additive genes in wheat (Triticum aestivum), and to identify the most efficient crossing and selection methodologies in terms of genetic gains and cost efficiency. Segregating populations were derived from 18 simple crosses and the same number of top (three-way) crosses. Half of the crosses were derived from Yecora 70 and the other half from Veery #10 as the common leaf rust susceptible parents. The four selection schemes were: pedigree, modified bulk (F₂ and F₁-top as pedigree, selected lines in F₃, F₄, F₂-top, F₃-top as bulk; and pedigree in F₅ and F₄-top populations), selected bulk (selected plants in F₂, F₃, F₄, F₁-top, F₂-top and F₃-top as bulk; and pedigree in F₅ and F₄-top populations), and nonselected bulk (bulk in F₂, F₃, F₄, F₁-top, F₂-top and F₃-top; and pedigree in F₅ and F₄-top populations). A total of 320 progeny lines, parents and checks were tested for grain yield, other agronomic traits and leaf rust resistance during the 1992/93 and 1993/94 seasons in Ciudad Obregon (Sonora State, Mexico) which represents a typical high yielding irrigated site. The influence of the type of cross and the selection scheme on the mean grain yield and other traits of the progenies was minimal. The selection of parents was the most important feature in imparting yield potential and other favourable agronomic traits. Moreover, the highest yielding lines were distributed equally. Progeny lines derived from Veery #10 crosses had significantly higher mean grain yield compared to those derived from the Yecora 70 crosses. Furthermore, a large proportion of the highest yielding lines also originated from Veery #10 crosses. Mean leaf rust severity of the top cross progenies was lower than that of the simple cross progenies possibly because two parents contributed resistance to top cross progenies. Mean leaf rust severity of the nonselected bulk derivatives was twice that of lines derived from the other three schemes. Selected bulk appears to be the most attractive selection scheme in terms of genetic gains and cost efficiency. This revised version was published online in August 2006 with corrections to the Cover Date.     

Development and characterization of common black bean lines resistant to anthracnose,rust and angular leaf spot in Brazil

Anthracnose, rust and angular leaf spot caused by Colletotrichum lindemuthianum, Uromyces appendiculatus and Pseudocercospora griseola, respectively, are economically important diseases affecting the common bean production in Brazil. The BIOAGRO/UFV bean breeding program developed Rudá-R, a dry bean line with ‘carioca’ seed type, containing the following disease resistance genes: Co-4, Co-6 and Co-10 (anthracnose); Ur-ON (rust) and Phg-1 (angular leaf spot). To transfer this combination of disease resistance genes present in Rudá-R to a black-seeded bean, a backcrossing program aided by molecular markers was conducted, involving Rudá-R (donor genitor) and Diamante Negro (recurrent genitor). Forty black-seeded BC₃F_3:6 lines were obtained with combinations of at least three markers linked to the indicated disease resistance genes. The lines were evaluated for resistance to the three mentioned pathogens. Eight of the lines were homozygous and resistant to all four evaluated races of C. lindemuthianum, but susceptible to race 2047. Four of the lines were homozygous and resistant to two races of U. appendiculatus. Twenty of the lines were homozygous and resistant to the two races of P. griseola tested. Grain yield of the BC₃F_3:6 lines was evaluated during the ‘winter’ season of 2006 and the ‘dry’ season of 2007. All lines had statistically equal or higher yields than Rudá-R and Diamante Negro. Lines were identified that not only were high yielding but also resistant to the three pathogens tested. These lines are potential genotypes for further testing and for release as new black common bean varieties.     

Identification of quantitative trait loci associated with resistance to foliar diseases in sorghum [<Emphasis Type="Italic">Sorghum bicolor</Emphasis> (L.) Moench]

Forage sorghum cultivars grown in India are susceptible to various foliar diseases, of which anthracnose, rust, zonate leaf spot, drechslera leaf blight and target leaf spot cause severe damage. We report here the quantitative trait loci (QTLs) conferring resistance to these foliar diseases. QTL analysis was undertaken using 168 F₇ recombinant inbred lines (RILs) of a cross between a female parental line 296B (resistant) and a germplasm accession IS18551 (susceptible). RILs and parents were evaluated in replicated field trials in two environments. A total of twelve QTLs for five foliar diseases on three sorghum linkage groups (SBI-03, SBI-04 and SBI-06) were detected, accounting for 6.9–44.9% phenotypic variance. The morphological marker Plant color (Plcor) was associated with most of the QTL across years and locations. The QTL information generated in this study will aid in the transfer of foliar disease resistance into elite susceptible sorghum breeding lines through marker-assisted selection.     

Simultaneous selection for resistance to five bacterial, fungal, and viral diseases in three Andean?��?Middle American inter-gene pool common bean populations

Numerous bacterial, fungal, and viral diseases cause severe damage on roots, foliage, stem, pods, and seeds, resulting in yield and quality losses in common bean (Phaseolus vulgaris L.) worldwide. Cultivars with resistance to multiple diseases are needed to reduce these losses and dependence on pesticides for disease control. Our objective was to determine the effectiveness of simultaneous selection in the F₁ and F₂ for resistance to five diseases, namely angular leaf spot (ALS), anthracnose (ANT), bean common mosaic (BCM), common bacterial blight (CBB), and common bean rust (CBR) in three Andean x Middle American inter-gene pool double-cross populations, namely ST?=???Chocho??/??Catrachita??//G 5686/VAX 3, CN?=???DIACOL Calima??/VAX 6//A 193/G 5686, and CB?=?A 483/??Talash??//Wilkinson 2/G 5686. One hundred seventy-five F₁ plants of ST, 177 of CN, and 195 of CB and their parents were evaluated in the greenhouse using sequential inoculations with pathogens causing BCM, CBR, ALS, CBB, and ANT, in that order. Progenies of surviving F₁ plants were again evaluated in the F₂, using similar sequential inoculations. The F₄-derived F₅ breeding lines were developed using single-seed descent method. No selection was practiced for any trait in the F₃ and F₄. In the F₅, five breeding lines from ST, two from CN, and one from CB exhibited intermediate to high levels of resistance to the five diseases when compared with the parents. Thus, selection in the F₁ and F₂ was effective for simultaneous introgression of resistance to the five diseases in all three Andean?×?Middle American inter-gene pool common bean populations.     

Molecular marker-assisted selection for development of common bean lines resistant to angular leaf spot

The objective of this work was to develop homozygous common bean lines carrying angular leaf spot resistance genes derived from the cultivars ‘Mexico 54’, ‘MAR 2’ and ‘BAT 332’ through marker‐assisted selection. Molecular markers SCAR OPN02₈₉₀, RAPD OPE04₅₀₀ and OPAO12₉₅₀ linked to the resistance genes of ‘Mexico 54’, ‘MAR 2’ and ‘BAT 332’, respectively, were used in segregating backcross‐derived populations to selection. DNA fingerprinting was used to select homozygous BC₂F₃ and BC₁F₃ resistant plants genetically closer to the recurrent parent. Two homozygous BC₂F_2:3 and two and five BC₁F_2:3 families derived from ‘Ruda’ vs. ‘Mexico 54’ (RM), ‘MAR 2’ (RMA) and ‘BAT 332’ (RB) crosses were selected, respectively. After only one (RMA, RB) or two backcrosses (RM), five and eight BC₁F₃ lines derived from RMA and RB, respectively, and seven BC₂F₃ lines derived from RM, with 14.9–16.6, 16.9–18.6 and 9.3–11.1% of relative genetic distances to the recurrent parent were selected. This is the first report of lines resistant to angular leaf spot carrying genes of the cultivars ‘Mexico 54’, ‘MAR 2’ and ‘BAT 332’ developed with the aid of molecular markers.     

Variation and inheritance of leaf angle, and its association with spot blotch (Bipolaris sorokiniana) severity in wheat (Triticum aestivum)

One thousand four hundred and seven spring wheat germplasm lines belonging to Indian and CIMMYT wheat programs were evaluated for their leaf angle and resistance to spot blotch caused by Bipolaris sorokiniana during three consecutive crop seasons, 1994–95, 1995–96 and 1996–97.Disease severity was recorded at six different growth stages beginning from tillering to late milk stage. Three crosses (M 3109 × Sonalika, HP 1808 × K 9006 and HD 2662 × K 9006) were made between genotypes with erect and drooping leaves. M 3109 was resistant, Sonalika susceptible while the other three lines possessed moderate resistance to spot blotch. Individually threshed F₂ plants were used to advance the generations. Leaf angle and spot blotch resistance were recorded in parents, F₁, F₃, F₄and F₅ generations. Leaf erectness in F₁ generation showed partial dominance. Evaluation of F₃, F₄ and F₅ progenies(120–150) revealed that leaf angle was under the control of few genes that appeared to be close to three. Germplasm lines with erect and semi-erect leaves displayed lower spot blotch severity than those having drooping and semi-drooping leaves. Lines homozygous for erect leaf posture in F₃,F₄ and F₅ generations showed significantly lower mean AUDPC than those with drooping leaves. A positive correlation (0.58) between leaf angle and AUDPC further indicated a positive influence of leaf erectness on severity to spot blotch disease. This revised version was published online in August 2006 with corrections to the Cover Date.     

Heterosis and mixing effects in barley under drought stress

Yield stability is one of the main breeding objectives in breeding for stress environments, such as the semi‐arid areas of Syria. The objectives of this study were to measure the effects of heterogeneity and heterozygosity on yield and yield stability by comparing doubled haploid lines (DHL) in mixed vs. pure stand (influence of heterogeneity) and F₂ populations vs. corresponding DHL mixtures (influence of heterozygosity). Six barley lines from two gene pools (LR = landraces, EL = experimental lines) were used to produce nine crosses (two LR × LR, three EL × EL, four LR × EL). The F₂ generation and eight DHL per cross were produced from each cross. The six parental DHL, nine F₂ populations, nine 8‐line mixtures and 72 DHL in pure stands were tested in five environments under drought stress in north Syria. The mean superiority of F₂ populations over DHL mixtures for yield traits across environments and cross combinations ranged between 7.5 and 10%. The effect of heterogeneity was small throughout. For grain yield, harvest index, 1000‐grain weight and plant height significant interactions between heterozygosity levels and environments were observed. The effect of heterozygosity for grain yield increased substantially from ‐1.2% in the highest‐yielding environment to 45.6% in the most stressful environment. Interactions between levels of heterozygosity and cross combinations were significant for most traits. F₂ populations were considerably more stable than DHL in pure stands, yet not as stable as DHL mixtures. It is concluded that heterozygosity is more important than heterogeneity in breeding for improved yield and yield stability under drought stress.     

Inheritance of resistance to angular leaf spot in common bean and validation of the utility of resistance linked markers for marker assisted selection out side the mapping population

Inheritance of resistance to angular leaf spot (ALS) disease caused by Phaeoisariopsis griseola (Sacc.) Ferr was investigated in two common bean cultivars, Mexico 54 and BAT 332. Both Andean and Mesoamerican backgrounds were used to determine the stability of the resistance gene in each of the two cultivars. Resistance to P. griseola was phenotypically evaluated by artificial inoculation with one of the most widely distributed pathotypes, 63–39. Evaluation of the parental genotypes, F₁, F₂ and backcross populations revealed that the resistance to angular leaf spot in the cultivars Mexico 54 and BAT 332 to pathotype 63–39 is controlled by a single dominant gene, when both the Andean and Mesoamerican backgrounds were used. Allelism test showed that ALS resistance in Mexico 54 and BAT 332 to pathotype 63–39 was conditioned by the same resistance locus. Resistant and susceptible segregating populations generated using Mexico 54 resistant parent were selected for DNA extraction and amplification to check for the presence /absence of the SCAR OPN02 and RAPD OPE04 markers linked to the Phg-2 resistance gene. The results indicated that the SCAR OPN02 was not polymorphic in the study populations and therefore of limited application in selecting resistant genotypes in such populations. On the other hand, the RAPD OPE04 marker was observed in all resistant individuals and was absent in those scored susceptible based on virulence data. Use of the RAPD OPE04 marker in marker-assisted selection is underway.     

Lack of durability of resistance to cereal rusts in wheat when selection is for complete resistance

Twenty-one bread-wheat entries were selected after careful screening for complete or near-complete resistance to yellow rust (Puccinia striiformis), stem rust (P. graminis), and leaf rust (P. recondita). In 1987, the 21 entries were intercrossed in a near-half diallel scheme. The resulting 190 F₂ populations were advanced to F₇ under selection for complete resistance to the three rusts and for good agronomic types. In 1992 the 21 parents and 140 selected F₇ lines were assessed for their resistance to the three rusts. Of the 21 parents, 12 showed a breakdown of yellow rust resistance, five a breakdown of stem rust resistance and two a breakdown of leaf rust resistance. In addition, several of the 140 selected F₇ lines, all still resistant in F₆, had become susceptible to one or more of the rusts. It appears that a progression towards more complex races, especially of yellow rust, is inevitable for the wheat-cereal rust patho-systems when the selection is for complete or near-complete resistance.     

Inheritance of resistance to angular leaf spot in Nicotiana tabacum L. cultivars burley 21 and kentucky 14

Summary The genetics of resistance to angular leaf spot caused by Pseudomonas syringae pv. tabaci in Nicotiana tabacum cultivars Burley 21 and Kentucky 14 was investigated by studying disease reactions to three isolates of parental, F₁, F₂ and backcross generations derived from crosses between the resistant cultivars and the susceptible cultivar Judy's Pride. Studies were conducted in the greenhouse and in field plant beds. Chi-square values were computed to determine whether the observed ratios for disease reactions deviated from expected Mendelian ratios for a single, dominant gene controlling resistance to angular leaf spot in tobacco. Based on the resistance of the F₁ and the backcross generation to the resistant parent (BC-R), a 3 resistant: 1 susceptible segregation ratio in the F₂, and a 1 resistant: 1 susceptible segregation ratio in the backcross generation to the susceptible parent (BC-S), it was concluded that resistance to three isolates of Pseudomonas syringae pv. tabaci is governed by a single, dominant gene.     

Selection for multiple disease resistance reduces cucumber yield potential

Summary Experiments were conducted in Wisconsin and Michigan to determine whether selection for multiple disease resistance adversely affects yielding ability of commercial cucumber (Cucumis sativus var. sativus L.; CS) lines. Inbred F₄ and F₅ lines were developed from C. sativus var. hardwickii (R.) Alef. (CH) x CS which had been either selected or not selected for resistance to the causal organisms of scab, anthracnose, and downy mildew. The exotic CH germplasms possesses a multiple fruiting habit with high yield potential and the CS genotypes include several disease resistance. In each comparison between selected and unselected progeny, the unselected families either significantly outyielded, or were not significantly different than their selected counterparts. In no case did the selected progeny outyield the unselected progeny. Since this was observed for both fruit number per plant and total fruit weight per plant, and it occurred despite differences in fruit size, we conclude that selection for disease resistance led to a reduction in yield potential in these populations.Received for publication-. The cost of publishing this paper was defrayed in part by the payment of page charges. Under postal regulations, this paper therefore must be hereby marked advertisement solely to indicate this fact.     

Inheritance of resistance to angular leaf spot (Isariopsis griseola Sacc.) in french bean (Phaseolus vulgaris L.)

Summary Angular leaf spot (Isariopsis griseola Sacc.) is a serious disease of French bean in the hills of India and 40 to 70 per cent of the green pods are damaged and rendered unmarketable. Crosses were made between PLB 257, (Phaseolus coccineus L.), a red flowering pole tope, resistant to angular leaf spot, and Contender (Phaseolus vulgaris L.), a highly susceptible commercial cultivar. Studies of the F₁, F₂, and F₃ progenies indicated that PLB 257, carries a recessive gene imparting resistance to angular leaf spot.     

Effect of plant density on selection for seed yield in two population types of Phaseolus vulgaris L.

Summary Pedigree selection for seed yield, using early generation yield tests, was practiced from the F₂ to F₇ in two populations of common bean (Phaseolus vulgaris L.) in three plant densities: 66, 133, and 266 thousand plants ha^-1 at CIAT-Palmira, Colombia. The six highest yielding lines selected from each plant-density, along with 13 parents, were evaluated in a 7×7 lattice design with three replications at the three densities utilized for selection, and at 399,000 plants ha^-1 in 1988 and 1989.Based on the mean performance of selected lines and the mean of the parents, selection for seed yield was effective in all densities in both populations. However, none of the lines selected from the population within the race Mesoamerica (TC 4673) significantly outyielded their best parent under any plant density. The highest yielding lines selected from the interracial population (TR 4635) outyielded their best parent irrespective of the plant-density used for selection. The highest yielding line originated from the highest density used for selection. Low density was neither good for selection nor for evaluation and identification of high-yielding cultivars of common bean. There was no significant difference between the mean yield of lines selected at the intermediate and high population densities. The effects of plant density, year, and their interactions were significant for seed yield.     

New sources of resistance to anthracnose and angular leaf spot of beans (Phaseolus vulgaris L.)

Summary over 13000 CIAT bean accessions were evaluated for their reactions to the anthracnose (Colletotrichum lindemuthianum) and angular leaf spot (Isariopsis griseola) pathogens over a 3 yr period. Among these accessions, 156 were resistant to all races of the anthracnose pathogen collected from Popayán, Colombia. Thirty were resistant to numerous races obtained from other parts of the world, including Europe. Although many of these new resistant sources originated in Mexico and Central America, they are quite diverse for geographic origin, plant type, seed color and seed size. In addition, more than 50 of the 156 lines were also resistant to isolates of I. griseola with diverse sources of origin throughout Colombia.     

Improvement of large-seeded common bean cultivars under sustainable cropping systems in Spain

Approaches are needed to broaden the genetic base and improve earliness and yield potential of large-seeded beans under sustainable cropping systems. The objective of this research was to develop adapted dwarf bean populations having a commercial seed quality and yield suitable for the production in the South of Europe. The original base populations were produced from crosses between genotypes within each Mesoamerica, Nueva Granada and Peru races, and between Peru and Nueva Granada, and Mesoamerica and Nueva Granada races. Visual mass selection for plant performance was practised in the F₂ and F₃ generations. In the F₄ and F₅, single plants were harvested under two cropping systems (sole cropping and intercropping with maize). From F₄, selection was based on precocity, combined with seed yield and seed commercial type. The F_4:7 selected lines from each original population were compared with their parents and five checks at four environments and two cropping systems. Differences among environments, populations, parents and checks were observed for all traits. Under intercropping with maize, there was a 50% reduction in seed yield. Yield of parents and checks belonging to Andean South American races, intraracial (Nueva Granada × Nueva Granada) and interracial (Nueva Granada × Peru) populations, was higher than that of those of Middle American origin. Intraracial crosses within large-seeded Andean South American (Peru race) and Middle American gene pools (Mesoamerica race) did not produce lines yielding more than the highest yielding parent. Only two large-seeded lines selected from crosses between small- and large-seeded gene pools out-yielded the best parent and check cultivar.     

Heritability estimates of field resistance to spot blotch in four spring wheat crosses

Spot blotch of wheat (Triticum aestivum L.), caused by Bipolaris sorokiniana (Sacc. in Sorok.) Shoem., is a major disease in South Asia. Popular commercial cultivars have low levels of resistance to spot blotch. Information on the inheritance of spot blotch resistance in wheat is lacking. Field studies were conducted in four wheat crosses, each involving a Chinese hexaploid parent with high levels of resistance and a commercial cultivar with low to intermediate levels of resistance to spot blotch. Data were recorded in the F₂, F₃ and F₄ generations to estimate heritability. Field studies were conducted in three years (1992–94) at Rampur. Nepal, involving 150 lines in each cross. The spot blotch score was recorded as the percentage necrosis and associated chlorosis of the two upper most leaf surface. In the F₂ generation three spot blotch readings on the flag leaf were taken whereas in the F₃ and F₄ generations four readings were recorded at 5-day intervals on the flag and the penultimate leaves. The highest disease score (HDS) and the area under disease progress curve (AUDPC) were analysed. Heritability (h²) estimates for spot blotch resistance were intermediate to high measured in terms of HDS (0.47 < h² < 0.67) and also AUDPC (0.58 < h² < 0.77) both in F₃ and F₄ generations in each of the four crosses. Heritability values were somewhat higher for AUDPC than HDS. There were significant negative correlations (r) of days to heading with HDS (-0.186 < r < -0.515) and AUDPC (-0.218 < r < -0.623). One-hundred kernel weight was significantly negatively correlated to AUDPC (-0.245 < r < -0.454) in all crosses in each generation. The results suggest that selection for resistance to spot blotch could be effective in the segregating populations generated from hexaploid wheat parents having different levels of resistance. Although AUDPC appeared to be a better measure to determine genetic differences for spot blotch in wheat, HDS would be adequate in screening trials for resistance to spot blotch.     

Development and agronomic performance of common bean lines simultaneously resistant to anthracnose, angular leaf spot and rust

The common bean is affected by several pathogens that can cause severe yield losses. Here we report the introgression of resistance genes to anthracnose, angular leaf spot and rust in the 'carioca-type' bean cultivar 'Rudá'. Initially, four backcross (BC) lines were obtained using 'TO', 'AB 136', 'Ouro Negro' and 'AND 277' as donor parents. Molecular fingerprinting was used to select the lines genetically closer to the recurrent parent. The relative genetic distances between 'Rudá' and the BC lines varied between 0.0% and 1.99%. The BC lines were intercrossed and molecular markers linked to the resistance genes were used to identify the plants containing the genes of interest. These plants were selfed to obtain the F₂, F₃ and F₄ plants which were selected based on the presence of the molecular markers mentioned and resistance was confirmed in the F₄ generation by inoculation. Four F_4:7 pyramid lines with all the resistance genes showed resistance spectra equivalent to those of their respective donor parents. Yield tests showed that these lines are as productive as the best 'carioca-type' cultivars.     

Selection for seed yield in Andean intra-gene pool and Andean × Middle American inter-gene pool populations of common bean

Yields of large-seeded Andean (A) common bean (Phaseolus vulgaris L.) cultivars of Chile and Nueva Granada races are 40 to 60% lower compared to their Middle American (M) counterparts of small-seeded Mesoamerica and medium-seeded Durango races. Our objective was to use the concept of congruity backcrossing between Andean x Middle American inter-gene pool [AM 11833 = A 483 (A)///// A 686 (M) //// PVA 800A(A)/// ‘Carioca’ (M)// Carioca (M)/ G 19833 (A)] and between races within Andean gene pool [i.e., intra-gene pool Andean, AA 11834 = A483 (A)//// ‘Cardinal’(A) /// ‘Blanco Español’(A) // BlancoEspañol (A) / ‘Taylor’ (A)] to compare selection for seed yield improvement of large-seeded Andean beans. Seven hundred sixty seven F₂-derived F₃ (F_2:3) families were produced for each population. Visual appraisal for total plant performance, combined with seed yield from non-replicated plots was used for selection of 551 families in F_2:3, 182 families in F_2:4, and 91 families in F_2:5 in each population. Eight hundred twenty three F_5:6 lines were developed from the 91 F_2:5 families in each population. Visual selection, combined with seed yield in non-replicated plots was again used to select 294 lines in F_5:6 in each population. Similarly, 44 highest yielding F_5:7 lines were selected in AM 11833 and 39 F_5:7 lines in AA 11834. Thus, single plant selections were made in the F₂ and F₅, and plants within each plot were harvested in bulk in F₃, F₄, F₆, and F₇. Thirty nine F_5:8 lines from AA 11834 and 44 lines from AM 11833, parents, and checks were evaluated at Popayán and Quilichao, Colombia in 1998 and 1999. Selected lines in both populations, on average, out-yielded the mean of their large-seeded Andean parents. Mean yield of the lines selected from AM 11833 was 50% higher than AA 11834 lines. Twelve F_5:8 lines out-yielded the highest yielding Andean parents G 19833 and A 483 in AM 11833, whereas only one line yielded significantly higher (p < 0.05) than the highest yielding parent A 483 in AA 11834. However, none of selected lines out-yielded small-seeded Middle American parents used in AM 11833 (A 686 and ‘Carioca’). The mean 100 seed-weight of AA 11834 was 36 g compared to 28 G for AM 11833 F_5:8 lines. Selected lines had similar days to maturity as parents in AM 11833, and matured 3 d later in AA11834. Correlation coefficients between yield and 100 seed-weight were negative in both populations. Yield and days to maturity were positively correlated in AA 11834.     

Stay green trait: variation, inheritance and its association with spot blotch resistance in spring wheat (Triticum aestivum L.)

One thousand four hundred and seven spring wheat germplasm lines belonging to Indian and CIMMYT wheat programs were evaluated for stay green (SG) trait and resistance to spot blotch caused by Bipolaris sorokiniana during three consecutive crop seasons, 1999–2000, 2000–2001 and 2001–2002. Disease severity was recorded at six different growth stages beginning from tillering to late milk stage. SG trait was measured by following two approaches: difference for 0–9 scoring of green coloration (chlorophyll) of flag leaf and spike at the late dough stage (GS 87) and a new approach of leaf area under greenness (LAUG). Germplasm lines showed a wide range (7–89) for LAUG and were grouped into four viz., SG, moderately stay green, moderately non-stay green and non-stay green (NSG). However, very few (2.2%) lines showed high expression of SG trait, i.e., LAUG >60. LAUG appeared to be a better measure of SG trait than a 0–9 scale. Mean spot blotch ratings of SG genotypes were significantly lower than those of NSG genotypes at all growth stages. Two spot blotch resistant genotypes (Chirya 3 and Chirya 7) having strong expressions of SG trait were crossed with NSG, spot blotch susceptible cv. Sonalika. Individually threshed F₂ plants were used to advance the generations. SG trait and spot blotch severity were recorded in the parents and F₁, F₃, F₄, F₅, F₆ and F_6–7 generations under disease-protected and inoculated conditions. SG trait in the F₁ generation was intermediate and showed absence of dominance. Evaluation of progenies (202–207) in the segregating generations revealed that SG trait was under the control of around four additive genes. Lines homozygous for SG trait in F₄, F₅, F₆ and F_6–7 generations showed significantly lower mean area under disease progress curve (AUDPC) for spot blotch than those with NSG expression. A positive correlation (0.73) between SG trait and AUDPC further indicated a positive influence of SG on severity of spot blotch. The study established that variation for SG trait exists in spring wheat; around four additive genes control its inheritance in the crosses studied and there is positive association between SG trait and resistance to spot blotch.