Effect of combining two genes for partial resistance to Barley yellow dwarf virus-PAV (BYDV-PAV) derived from Thinopyrum intermedium in wheat |
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| Authors: | J Jahier F Chain D Barloy A -M Tanguy J Lemoine G Riault E Margalé M Trottet E Jacquot |
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| Institution: | INRA, Agrocampus Rennes, UMR 118, Amélioration des Plantes et Biotechnologies Végétales;;INRA, UMR 1099, Biologie des Organismes et Populations appliquée àla Protection des Plantes, F-35653 Le Rheu;;and GIE Club 5, 83 avenue de la Grande Armée, 75182 Paris cedex 16, France |
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| Abstract: | In this study two sources of resistance to Barley yellow dwarf virus (BYDV), both originating from Thinopyrum intermedium , were combined in a single genotype, line ZT, using GISH (genomic in situ hybridization) and a new molecular marker of the partial resistance gene Bdv2 . Susceptible wheat cv. Sunstar, the translocation line TC14 carrying Bdv2 , the addition line ZH with the group-2 chromosome arm carrying resistance, and line ZT with both resistances were inoculated with five strains of Barley yellow dwarf virus -PAV. The tests confirmed the resistance of TC14 and ZH and revealed an additive effect of the two sources of resistance in ZT. The resistance of line ZT was characterized by a proportion of infected plants significantly lower than the parental lines TC14 and ZH (42% vs. a mean of 76% for the parents) and a very low virus titre (area under the virus concentration progress curve of 1·2 vs. a mean on 6·3 for the parents). |
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| Keywords: | chromosome durability GISH introgression molecular marker pyramiding Triticum aestivum |
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