亚麻抗枯萎病基因FuJ7(t)的分子标记

 用高抗枯萎病亚麻品种“晋亚 7号”与高感枯萎病品种“晋亚 1号”配制杂交组合 ,接种鉴定其正反交F1代以及F2 代分离群体的枯萎病发生情况 ,结果表明 ,晋亚 7号对枯萎病的抗性属于细胞核遗传 ,受 2个显性基因控制。用 4 8个EcoRI/MseI引物组合对“晋亚 7号”、“晋亚 1号”两个亲本及其F2 代抗病和感病基因池进行AFLP分析 ,共扩增出约 330 0条可分辨的带 ,其中 3条为稳定的差异。用“晋亚 7号”和“晋亚 1号”杂交产生的F2 代分离群体对 3个特异条带与目的基因的遗传连锁性进行分析 ,发现特异条带AG/CAG与暂定名为FuJ7(t)的抗枯萎病基因紧密连锁 ,二者之间的遗传距离为 5 .2cM。将AG/CAG片段回收、克隆和测序 ,成功地将其转化为SCAR标记 ,可以更加方便地用于对FuJ7(t)基因的分子检测和标记辅助选择。

Identification of Molecular Markers Linked to the Wilt Resistance Gene FuJ7(t) in Flax

A cross between wilt resistant flax variety "Jinya7" and susceptible variety "Jinya1" was made for mapping wilt resistance gene(s). Through inoculation test of its F 1 and F 2 progeny, it is proved that the resistance of "Jinya7" to wilt is controlled by two dominant genes. With 48 EcoRI/MseI primer combinations, AFLP analysis was performed on two parents and their F 2 resistant and susceptible bulks. A total of about 3 300 distinguishable bands were amplified, of which three were stable. Genetic linkage analysis of the three polymorphic DNA fragments with the resistance gene(s) was tested in the F 2 segregating population derived from the cross between "Jinya7" and "Jinya1". The DNA fragment AG/CAG was found closely linked to one of the wilt resistant genes, with a genetic distance of 5.2 cM, that was tentatively named FuJ7(t). The cloned fragment AG/CAG was sequenced and then converted successfully to a SCAR marker, which can be used more conveniently in the identification and marker assisted selection for gene FuJ7(t) to flax wilt.