| 利用离体技术鉴定小麦根腐病抗性研究 |
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| 引用本文： | 宋庆杰.利用离体技术鉴定小麦根腐病抗性研究[J].中国农学通报,2005,21(8):352-352. |
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| 作者姓名： | 宋庆杰 |
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| 作者单位： | 黑龙江省农科院作物育种所,哈尔滨,150086 |
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| 基金项目： | 黑龙江省农业科学院青年基金资助项目“利用离体技术鉴定小麦根腐病抗性研究”（2001-02-06）. |
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| 摘 要： | 通过不同处理的离体试验及田间对比试验，对离体鉴定技术应用于小麦抗叶部根腐病(H.sativum)育种的可行性进行了较深入的研究，试验证明：应用离体技术鉴定小麦叶部根腐病抗性结果准确、速度快，而且不受环境条件限制。同时，采用离体鉴定的方法对参试的2632份材料进行抗性评价，从中筛选出8份高抗和60份中抗的材料，其中17分来自人工合成六倍体小麦，51份来自普通小麦。
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| 关 键 词： | 小麦 根腐病 离体鉴定 抗源筛选 |
| 收稿时间： | 2005-02-25 |
| 修稿时间： | 2005-02-252005-03-17 |
Study on resistance evaluation of spot blotch caused by
H. sativum with detached leaves in wheat |
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| Song Qingjie.Study on resistance evaluation of spot blotch caused by
H. sativum with detached leaves in wheat[J].Chinese Agricultural Science Bulletin,2005,21(8):352-352. |
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| Authors: | Song Qingjie |
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| Institution: | (Crop Breeding Institute of Heilongjiang Academy of Agricultural Sciences, Harbin 150086) |
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| Abstract: | We studied feasibility of wheat breeding for resistance to spot blotch caused by H. sativum using detached leaves method, the results showed that using the evaluation method of detached leaves has some advantage including nicety, fast and no influence of environments. With this method, we evaluated 2632 lines and screened 8 lines with high resistance and 60 lines with medium resistance to spot blotch. Among the resistant lines, 17 are synthetic hexaploid wheat and 51 lines are common wheat. |
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| Keywords: | Wheat Spot blotch Evaluation with detached leaves Screening of resistance resource |
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