电子束及~(137)Cs γ射线对春小麦辐射遗传效应的研究

本试验以春小麦为材料,用~(137)Cs γ射线辐照为对比,主要研究了电子束对春小麦诱变的遗传效应及适宜剂量,调查了 M_1代生物学损伤、M_2代突变率和突变谱变化,观察了有丝分裂和减数分裂染色体畸变。结果表明:电子束的生物学损伤比~(137)Csγ射线要轻些;两者在诱发染色体畸变方面的情况相似;电子束与~(137)Cs γ射线相比,M_2代突变率较高,突变谱较宽。试验初步表明:电子束是一种较有应用价值的诱变源,它对春小麦的适宜剂量为2.93—3.58×10~4rad。而~(137)Cs γ射线对春小麦的适宜剂量略低于2.32×10~4rad。

THE GENETIC EFFECTS IN SPRING WHEAT IRRADIATED BY THE ELECTRON BEAM AND ~(137)Cs γ-RAYS

The genetic effects and appropriate doses of electron beam for irradia- tion concerning spring wheat were studied.The biological damage,chromo- somal aberration in mitosis and meiosis of M_1 and the mutation frequency in M_2 were analysed.The results show that the biological damage of elect- ron beam is less than that of ~(137)Cs γ-rays,but both of them has the sim- ilar ablity in inducing chromodomsal aberrations.Compared with ~(137)Cs γ-rays,mutation frequency in M_2 caused by electron beam is higher,and the mutation spectrum is wider.The result indicates that electron beam is a valuable radiation source in mutation breeding.Its appropriate doses for the spring wheat is between 2.93 and 3.58×10~4 rad,while the dosage of ~(137)Cs γ-rays is a little lower that 2,32×10~4 rad.