Genetic analysis of resistance to spot blotch disease in wheat (Triticum aestivum L.) in Zambia |
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| Authors: | Batiseba Tembo Julia Sibiya Pangirayi Tongoona Rob Melis |
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| Institution: | 1. African Centre for Crop Improvement, University of KwaZulu-Natal, College of Agriculture, Engineering and Science, School of Agricultural, Earth and Environmental Sciences, Scottsville, Pietermaritzburg South Africa;2. Zambia Agricultural Research Institute (ZARI), Mt. Makulu Research Station, Chilanga, Zambia;3. West African Centre for Crop Improvement, College of Basic and Applied Sciences, University of Ghana, Legon, Ghana |
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| Abstract: | Understanding the genetics of resistance to spot blotch disease, caused by Bipolaris sorokiniana (Sacc.) Shoem, is important to design an appropriate breeding strategy to improve the trait. The objective of this study was to determine the gene action and mode of inheritance of resistance to spot blotch in wheat. Eight genotypes with varying resistance to the disease were crossed in a full diallel mating design. Parents and their progenies were evaluated for spot blotch resistance. Data were analyzed using Hayman’s diallel analysis. The results suggested the importance of additive gene effects in controlling the resistance to spot blotch in the materials under study. No epistasis, maternal, or reciprocal effects were detected. Resistance to spot blotch exhibited partial dominance. Therefore, exercising selection for resistance in the early segregating generation should be an effective approach because of the predominance of additive gene effects. The Wr/Vr graph showed that the parents 30SAWSN5 (P3) and Coucal (P4) possessed more dominant genes, which makes them particularly suitable for inclusion in breeding for resistance to spot blotch. |
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| Keywords: | Additive effects Bipolaris sorokiniana breeding Hayman analysis Triticum aestivum L |
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