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杏低温薄层干燥试验与建模
引用本文:王宁,刘文秀,李凤城,杜志龙.杏低温薄层干燥试验与建模[J].农业机械学报,2011,42(1):140-143,153.
作者姓名:王宁  刘文秀  李凤城  杜志龙
作者单位:中国包装和食品机械总公司,北京,100083
基金项目:“十一五”国家科技支撑计划资助项目(2006BAD11A13)
摘    要:在较低温度下采用旋转组合设计对杏进行了薄层干燥试验,考察了温度、风速对杏干燥特性的影响。试验结果表明在一定范围内温度是影响干燥速率的主要因素,通过试验值回归,确定杏在较低温度下的干燥模型为Wang-Singh方程,且模型系数与温度、风速有关。试验值与模型预测值比较说明,该模型能较好地描述干燥过程中杏的水分比与干燥时间的关系。

关 键 词:  薄层干燥  数学模型  试验  

Thin Layer Drying Model of Apricot at Low Temperature
Wang Ning,Liu Wenxiu,Li Fengcheng and Du Zhilong.Thin Layer Drying Model of Apricot at Low Temperature[J].Transactions of the Chinese Society of Agricultural Machinery,2011,42(1):140-143,153.
Authors:Wang Ning  Liu Wenxiu  Li Fengcheng and Du Zhilong
Institution:Wang Ning Liu Wenxiu Li Fengcheng Du Zhilong (China National Packaging and Food Machinery Corporation,Beijing 100083,China)
Abstract:Thin layer drying experiments of apricot in low temperature were carried out on rotation design.The drying characteristics and the drying model of apricot were studied based on temperature and velocity of drying medium.The experiments showed that temperature was the main influencing factor in the drying process.The mathematical model was set as Wang-Singh equation at low temperature and the coefficients of the model were related to temperature and velocity.The established mathematical model could be used to...
Keywords:Apricot  Thin layer drying  Mathematical model  Experiment  
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