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| 小麦旗叶性状与产量因素的相关与回归分析 | |
| 引用本文： | 王敏,张从宇. 小麦旗叶性状与产量因素的相关与回归分析[J]. 种子, 2004, 23(3): 17-18,21 |
| 作者姓名： | 王敏 张从宇 |
| 作者单位： | 1. 安徽农业大学农学系,合肥,230036 2. 安徽技术师范学院,凤阳,233100 |
| 摘 要： | 以59个小麦品种(系)为试材,对旗叶性状与产量及产量因素作了相关与多元回归分析.结果表明,小麦旗叶的长、宽、叶面积、与茎杆的夹角、叶绿素含量与穗粒数、千粒重、穗粒重、产量等性状间的相关系数分别达显著或极显著水平,r=0.4851～0.7481.建立了旗叶性状与产量及产量因素的最优多元回归方程. |
| 关 键 词： | 小麦 旗叶 产量 相关分析 多元回归分析 |
Correlation and Rregression Analysis of Flag Leaf Traits and Yield Components in Wheat |
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| Wang Min ,Zhang Congyu. Correlation and Rregression Analysis of Flag Leaf Traits and Yield Components in Wheat[J]. Seed, 2004, 23(3): 17-18,21 | |
| Authors: | Wang Min Zhang Congyu |
| Affiliation: | Wang Min 1,Zhang Congyu 2 |
| Abstract: | The interrelationship between flag leaf trait and yield character was studied by using 59 varieties and lines in wheat. The experimental results showed that the flag leaf length, flag leaf width, flag leaf area and chlorophyll content of flag leaf were related positively with grain number per spike, 1000 grain weight, grain weight per spike and grain yield, and the angle between flag leaf and stem were related negatively with grain yield. The multiple regression equations were founded in flag leaf traits and yield characters. |
| Keywords: | Wheat Flag leaf Grain yield Correlation analysis Multiple regression analysis |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ | |