| A NEW TESTABILITY MEASURE OF DIGITAL CIRCUITS |
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| 引用本文： | Xiang Dong. A NEW TESTABILITY MEASURE OF DIGITAL CIRCUITS[J]. 保鲜与加工, 1992, 0(6): 98-105 |
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| 作者姓名： | Xiang Dong |
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| 作者单位： | Xiang Dong |
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| 摘 要： | A new scoap-like testability measure SCTM(a signal conflict oriented testability meaure) is presented, which represents not only the difficulty to control and observe the value of a node,but also the probability to cause signal conflict in the process of test generation. A parallel calculation scheme is offered, which speeds up the calculation m/2 times. Here m is the word length of a computer.
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| 关 键 词： | test / testability measure testability design controllability observability |
A NEW TESTABILITY MEASURE OF DIGITAL CIRCUITS |
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| Xiang Dong. A NEW TESTABILITY MEASURE OF DIGITAL CIRCUITS[J]. Storage & Process, 1992, 0(6): 98-105 |
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| Authors: | Xiang Dong |
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| Abstract: | A new scoap-like testability measure SCTM(a signal conflict oriented testability meaure) is presented, which represents not only the difficulty to control and observe the value of a node,but also the probability to cause signal conflict in the process of test generation. A parallel calculation scheme is offered, which speeds up the calculation m/2 times. Here m is the word length of a computer. |
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| Keywords: | test / testability measure testability design controllability observability |
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