Influence of high molecular weight glutenin subunit substitution on rheological behaviour and bread-baking quality of near-isogenic lines developed from Chinese wheats

Three near‐isogenic lines (NILs) of wheat involving Glu‐B1 and Glu‐D1 alleles were used to study the genetic contribution of high molecular weight glutenin subunits (HMW‐GS) to gluten strength. The HMW‐GS composition of each NILs was determined by SDS‐PAGE. No significant differences were found in grain protein contents among the NILs. Gluten strength and dough‐mixing properties were measured by the Farinograph, the Extensograph, and SDS‐sedimentation (SDS‐SE). Results indicated that line 2, containing the Glu‐1B 14 + 15 and Glu‐1D 5 + 10 combination of subunits, had higher values for flour quality, dough rheological parameters, and bread‐baking quality when compared with lines 8 and 13. Line 8, containing Glu‐1B 7 + 9 and Glu‐1D 5 + 10, was better than line 13 with the Glu‐1B 14 + 15 and Glu‐1D 10 combination. Some major parameters appeared significantly different. The presence of Glu‐1B 14 + 15 was associated with higher dough strength based on SDS‐SE volume and several rheological parameters when compared with Glu‐1B 7 + 9. Lines with subunit 10 at Glu‐D1 performed significantly worse than those with 5 + 10 in gluten index, SDS‐SE volume, Farinograph stability time, Extensograph area and bread‐baking quality.     

Selection for resistance to Septoria nodorum in wheat

Summary A population of 572 F₂ derived F₃ lines from six crosses were used to estimate parameters relevant to selection for resistance to Septoria nodorum of wheat. Lines were grown in disease free (fungicide sprayed) and inoculated microplots in 2 replications of a split-plot design in a single environment in 1977. Average yield reduction due to disease was approximately 50%; this was associated with an average septoria score of 50% on the flag leaf, an average septoria score of 42% on the head, and a reduction of 37% in seed weight. Low S. nodorum scores were correlated with late heading date, tall plant height, high grain yield, and high seed weight in diseased plots, and high seed weight % (seed weight in diseased plots expressed as a percentage of seed weight in fungicide sprayed plots).Restricted selection indexes were used to study the relative contributions of disease escape, true resistance, and tolerance to variability in grain yield in diseased plots, seed weight in diseased plots, and seed weight %. True resistance appeared to be the most important factor causing variation in grain yield in diseased plots and seed weight %. Tolerance and escape seemed to be more important for seed weight in diseased plots.Heritabilities of S. nodorum scores on the flag leaf and head were 63% and 52%, respectively. Leaf and head scores could be used most effectively as selection criteria to upgrade resistance in a population before harvest.Selection for high seed weight % slightly reduced yields in disease free plots, although yield in diseased plots and seed weight in diseased plots were increased. However, selection for increased yield or increased seed weight in diseased plots improved yield in disease free plots. It is suggested that direct selection for yield or seed weight in diseased plots is likely to achieve more desirable goals than selection for seed weight %.     

Inheritance and chromosomal location of the homoeologous genes affecting phenol colour reaction of kernels in durum wheat

End-use quality of wheat for noodles is influenced by polyphenol oxidase activity and its corresponding substrates. This study investigated the chromosomal location of genes that determine phenol colour reaction of kernels in tetraploid wheat using aneuploid stocks. Polyphenol oxidase activity was estimated by the colour reaction of kernels to phenol solution. It was found that the genes located on homoeologous group 2 chromosomes have an important effect on the level of phenol colour reaction of kernels. The genes (Tc1 and Tc2) responsible for high phenol colour reaction of kernels were mapped to the long arms of chromosome 2A and chromosome 2B, respectively. The map distances were estimated to be 46.8 cM for Tc1 and 40.7 cM for Tc2 from the centromere using double-diltelosomics of durum wheat.     

AFLP analysis indicates no introgression of maize DNA in wheat x maize crosses

Amplified fragment length polymorphisms (AFLPs) were used to follow the possible introgression of maize DNA into haploids of wheat as a side‐effect of exploiting wheat x maize hybridization for haploid production. AFLPs were generated with 64 MseI/ EcoRI and 64 MseI/ PstI primer combinations, and the AFLP profiles of haploids were tested against those of maize and of the regular wheat varieties involved in the crosses. On average, 45.1 and 110.7 fragments were produced per assay with the MseI/EcoRI and MseI/PstI combinations, respectively. Different numbers of fragments were produced for wheat and maize: an average of 81 in the haploid, 80 in the wheat parent, and only 67.1 in maize. No evidence was found for introgression of maize into the wheat genome. Three unique AFLP fragments were detected in haploids, which were not present in the parental wheat genotypes. These ‘novel’ AFLP bands in the haploids could be caused by nucleo‐cytoplasmic interaction in the hybrid zygote. Such instability in the wheat genome is defined as temporal, as it was not detected in further generations when colchicine‐doubled progeny of the haploids was tested for the presence of polymorphic fragments.     

Identification of resistance gene analogue markers closely linked to wheat powdery mildew resistance gene Pm31

Specific oligonucleotide primers, designed for the sequences of known plant disease resistance genes, were used to amplify resistance gene analogues (RGAs) from wheat genomic DNA. This method was applied in a bulked segregant analysis to screen for the RGA markers linked to the powdery mildew resistance gene Pm31, introgressed into common wheat from wild emmer. Two RGA markers (RGA200 and RGA390) were found to be closely linked to Pm31 and completely co‐segregating with the marker allele of Xpsp3029 linked to Pm31, with a genetic distance of 0.6 cM. These two RGA markers were then integrated into the formerly established microsatellite map of Pm31 region. The result showed the effectiveness of the RGA approach for developing molecular markers linked to disease resistance genes and demonstrated the efficiency of denaturing polyacrylamide‐gel electrophoresis for detecting polymerase chain reaction polymorphism.     

Inheritance and allelic relationships of resistances to the Russian wheat aphid in two Iranian wheat lines

Russian wheat aphid (RWA), Diuraphis noxia (Kurdjumov), is a serious pest of small grains in many countries. A previous study screened 70 genotypes, collected from different parts of Iran, for RWA resistance. Four crosses were made between two resistant lines (Shz.W-102 and Shz.W-104) and two susceptible lines (Shz.W-101 and Shz.W-103). Parents, F₁, F₂, and BCF₁ seedlings were screened for RWA resistance in the greenhouse by artificial infection. To determine allelism, the two resistant lines were intercrossed and F₁, and F₂ seedlings were evaluated. Resistance in Shz.W-102 and Shz.W-104, when crossed with Shz.W-101, was controlled by one dominant gene. However, resistance in Shz.W-102 and Shz.W-104, when crossed with Shz.W-103, was controlled by two dominant genes. Genes in two resistant lines segregated independently of each other. A three-gene system was proposed to govern resistance in the lines under study . This revised version was published online in July 2006 with corrections to the Cover Date.     

Assessment of partial resistance to powdery mildew in Chinese wheat varieties

Field trials in two cropping seasons and two locations in central China were conducted on 60 Chinese autumn‐sown wheat varieties to assess their partial resistance to powdery mildew. Mean levels of disease severity ranged from close to 0 to more than 90%. The method of inoculation and the location in which trials were conducted affected the relative performance of the varieties, but these effects were much smaller than the main effect of variety. The area under the disease progress curve was highly correlated with final disease severity, but both were poorly correlated with apparent infection rate. Disease severity was regressed against frequencies of virulence in the Blumeria graminis (syn. Erysiphe graminis) f sp. tritici populations in the trial plots. A vertical distance (D) from the mean mildew severity to the fitted line was calculated for each variety and was used to quantify partial resistance. Five of the 60 varieties, ‘Hx8541’, ‘E28547’, ‘Chuan1066’, ‘Zhe88pin6’ and ‘Lin5064’, consistently expressed relatively low levels of disease despite high frequencies of virulence in the pathogen and had consistently high D‐values. They may therefore have good levels of partial resistance.     

Gene-for-gene relationship for resistance in wheat to isolates of Karnal bunt, Neovossia indica

Reactions to eight isolates of Karnal bunt, Neovossia indica, collected from seven different locations in northern India were studied on 13 host lines, including cultivars and breeding lines of Triticum aestivum, Triticum durum and Triticosecale in all possible combinations. The incidence of Karnal bunt varied from zero in PBW 34 and PBW 248 with isolates Ni8 and Ni2, respectively, to as high as 66.8% in a highly susceptible cultivar WL 711 with isolate Ni5. The differences in disease incidence among cultivars and isolates were highly significant. All the isolates could be distinguished on the basis of differential reactions on one or more of the host lines. Even the most resistant lines of durum (PDW 215), triticale (TL 1210) and wheat (HD 29) could be distinguished by the differential disease reaction with one or more of the eight isolates. The cultivar-isolate interaction for disease score was highly significant, indicating the probable existence of a gene-for-gene relationship in this host-pathogen system.     

Chromosome locations of leaf rust resistance genes in selected tetraploid wheats through substitution lines

Langdon durum D-genome disomic substitution lines were used to study the chromosome locations of adult-plant leaf rust resistance genes identified from tetraploid wheat accessions. The accessions are 104 (Triticum turgidum subsp. dicoccum var. arras) and 127 (T. turgidum subsp. durum var. aestivum). The complete sets of the substitution lines were crossed as female parents with the accessions and F₁ double monosomic individuals selected at metaphase I. Segregating F₂ individuals were inoculated during the flag leaf stage with pathotype UVPrt2 of Puccinia triticina. The substitution analysis involving accession 104 showed that the gene for leaf rust resistance is located on chromosome 6B. The analysis with accession 127 indicated that chromosome 4A carries a gene for leaf rust resistance. The two novel genes are temporarily designated as Lrac104 and Lrac127, respectively from accessions 104 and 127.     

A leaf rust resistance gene, different from Lr34, associated with leaf tip necrosis in wheat

The gene Lr34 has contributed to durable resistance to leaf rust caused by Puccinia triticina in wheat worldwide. The closely associated leaf tip necrosis is generally used as the gene's marker. Lr34 has been postulated in many Indian bread wheat cultivars including ‘C 306’, based on the associated leaf tip necrosis and a few other field and glasshouse observations. The present study showed monogenic control of adult‐plant resistance in ‘C 306’ to leaf rust pathotype 77‐5 (121R63‐1). The F₂ segregation in the crosses between ‘C 306’ and the two known carriers of Lr34, ‘Line 897’ and ‘Jupateco 73’‘R’ fitted a digenic ratio. The F₃ families derived from the susceptible F₂ segregants were true breeding for susceptibility, proving the absence of Lr34 in ‘C 306’. The cross between ‘Line 897’ and ‘Jupateco 73’‘R’ did not segregate for susceptibility. Resistance in the cross ‘Agra Local’ (susceptible) × ‘C 306’ was associated with leaf tip necrosis, showing that the leaf rust resistance gene in ‘C 306’ was associated with leaf tip necrosis, but was different from Lr34. This gene is being temporarily designated as Lr‘C 306’. Hence, leaf tip necrosis cannot be considered as an exclusive marker for selecting Lr34 in wheat improvement.